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High‐Pressure High‐Temperature Single‐Crystal Diamond Type IIa Characterization for Particle Detectors
Various samples of multisectoral high‐pressure high‐temperature (HPHT) single‐crystal diamond plate (IIa type) (4 × 4 × 0.53 mm) are tested for particle detection applications. The samples are investigated by X‐ray diffractometry, photoluminescence spectroscopy, Raman spectroscopy, Fourier‐transform...
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Published in: | Physica status solidi. A, Applications and materials science Applications and materials science, 2020-04, Vol.217 (8), p.n/a |
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creator | Chernykh, Sergey V. Chernykh, Alexey V. Tarelkin, Sergey A. Kondakov, Mikhail N. Shcherbachev, Kirill D. Trifonova, Ekaterina V. Drozdova, Taisia E. Troschiev, Sergey Yu Prikhodko, Dmitry D. Glybin, Yury N. Chubenko, Alexander P. Britvich, Gennady I. Kiselev, Dmitry A. Polushin, Nikolay I. Rabinovich, Oleg I. Didenko, Sergey I. |
description | Various samples of multisectoral high‐pressure high‐temperature (HPHT) single‐crystal diamond plate (IIa type) (4 × 4 × 0.53 mm) are tested for particle detection applications. The samples are investigated by X‐ray diffractometry, photoluminescence spectroscopy, Raman spectroscopy, Fourier‐transform infrared, and visible/ultraviolet (UV) absorption spectroscopy. High crystalline perfection and low impurity concentration (in the {100} growth sector) are observed. To investigate detector parameters, circular 1.0 and 1.5 mm diameter Pt Schottky barrier contacts are created on {111} and {100} growth sectors. On the backside, a Pt contact (3.5 × 3.5 mm) is produced. The {100} growth sector is proved to be a high‐quality detector: the full width at half maximum energy resolution is 0.94% for the 5.489 MeV 226Ra α‐line at an operational bias of +500 V. Therefore, it is concluded that the HPHT material {100} growth sector is used for radiation detector production, whose quality is not worse than the chemical vapor deposition method or specially selected natural diamond detectors.
High‐pressure high‐temperature (HPHT) single‐crystal diamond {100} growth sector is used for radiation detector production, The photoluminescence spectroscopy method, X‐ray diffraction (XRD), Raman spectroscopy, Fourier‐transform infrared spectroscopy (FTIR), and visible/ultraviolet (UV) absorption are used for structural investigation. The quality of the grown material is not worse than that grown by the chemical vapor deposition method or specially selected natural diamond detectors. |
doi_str_mv | 10.1002/pssa.201900888 |
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fullrecord | <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_journals_2394761423</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>2394761423</sourcerecordid><originalsourceid>FETCH-LOGICAL-c4208-46e1135bd12b9f27072415b770aa3869307e1c6962077d434e0d0482211de7b23</originalsourceid><addsrcrecordid>eNqFkE9PwkAQxTdGExG9em7iGZz9Q7c9kqJCQiIJeN5s2yksKW3dXWLqyY_gZ_STWALBo6eZeXlvXvIj5J7CkAKwx8Y5PWRAY4Aoii5Ij0YhG4ScxpfnHeCa3Di3BRAjIWmPlFOz3vx8fS8sOre3GJzuFe4atNofpKWp1iV2YmJb53UZTIze1VUerNoGg9lMB8lGW515tOZTe1NXQVHbYKGtN1mJwQQ9Zr627pZcFbp0eHeaffL2_LRKpoP568ssGc8HmWAQDUSIlPJRmlOWxgWTIJmgo1RK0JpHYcxBIs3COGQgZS64QMhBRIxRmqNMGe-Th-Pfxtbve3Rebeu9rbpKxXgsZEgF451reHRltnbOYqEaa3batoqCOhBVB6LqTLQLxMfAhymx_cetFsvl-C_7C7-rfRQ</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>2394761423</pqid></control><display><type>article</type><title>High‐Pressure High‐Temperature Single‐Crystal Diamond Type IIa Characterization for Particle Detectors</title><source>Wiley-Blackwell Read & Publish Collection</source><creator>Chernykh, Sergey V. ; Chernykh, Alexey V. ; Tarelkin, Sergey A. ; Kondakov, Mikhail N. ; Shcherbachev, Kirill D. ; Trifonova, Ekaterina V. ; Drozdova, Taisia E. ; Troschiev, Sergey Yu ; Prikhodko, Dmitry D. ; Glybin, Yury N. ; Chubenko, Alexander P. ; Britvich, Gennady I. ; Kiselev, Dmitry A. ; Polushin, Nikolay I. ; Rabinovich, Oleg I. ; Didenko, Sergey I.</creator><creatorcontrib>Chernykh, Sergey V. ; Chernykh, Alexey V. ; Tarelkin, Sergey A. ; Kondakov, Mikhail N. ; Shcherbachev, Kirill D. ; Trifonova, Ekaterina V. ; Drozdova, Taisia E. ; Troschiev, Sergey Yu ; Prikhodko, Dmitry D. ; Glybin, Yury N. ; Chubenko, Alexander P. ; Britvich, Gennady I. ; Kiselev, Dmitry A. ; Polushin, Nikolay I. ; Rabinovich, Oleg I. ; Didenko, Sergey I.</creatorcontrib><description>Various samples of multisectoral high‐pressure high‐temperature (HPHT) single‐crystal diamond plate (IIa type) (4 × 4 × 0.53 mm) are tested for particle detection applications. The samples are investigated by X‐ray diffractometry, photoluminescence spectroscopy, Raman spectroscopy, Fourier‐transform infrared, and visible/ultraviolet (UV) absorption spectroscopy. High crystalline perfection and low impurity concentration (in the {100} growth sector) are observed. To investigate detector parameters, circular 1.0 and 1.5 mm diameter Pt Schottky barrier contacts are created on {111} and {100} growth sectors. On the backside, a Pt contact (3.5 × 3.5 mm) is produced. The {100} growth sector is proved to be a high‐quality detector: the full width at half maximum energy resolution is 0.94% for the 5.489 MeV 226Ra α‐line at an operational bias of +500 V. Therefore, it is concluded that the HPHT material {100} growth sector is used for radiation detector production, whose quality is not worse than the chemical vapor deposition method or specially selected natural diamond detectors.
High‐pressure high‐temperature (HPHT) single‐crystal diamond {100} growth sector is used for radiation detector production, The photoluminescence spectroscopy method, X‐ray diffraction (XRD), Raman spectroscopy, Fourier‐transform infrared spectroscopy (FTIR), and visible/ultraviolet (UV) absorption are used for structural investigation. The quality of the grown material is not worse than that grown by the chemical vapor deposition method or specially selected natural diamond detectors.</description><identifier>ISSN: 1862-6300</identifier><identifier>EISSN: 1862-6319</identifier><identifier>DOI: 10.1002/pssa.201900888</identifier><language>eng</language><publisher>Weinheim: Wiley Subscription Services, Inc</publisher><subject>Chemical vapor deposition ; diamond detectors ; Diamonds ; Energy resolution ; high-pressure high-temperature diamonds ; high-pressure high-temperature methods ; multisectorial diamond plates ; particle detectors ; Photoluminescence ; Radiation counters ; Radiation detectors ; Radium 226 ; Raman spectroscopy ; Sensors ; single-crystal diamond ; Spectrum analysis</subject><ispartof>Physica status solidi. A, Applications and materials science, 2020-04, Vol.217 (8), p.n/a</ispartof><rights>2020 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c4208-46e1135bd12b9f27072415b770aa3869307e1c6962077d434e0d0482211de7b23</citedby><cites>FETCH-LOGICAL-c4208-46e1135bd12b9f27072415b770aa3869307e1c6962077d434e0d0482211de7b23</cites><orcidid>0000-0002-9164-6186</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,780,784,27924,27925</link.rule.ids></links><search><creatorcontrib>Chernykh, Sergey V.</creatorcontrib><creatorcontrib>Chernykh, Alexey V.</creatorcontrib><creatorcontrib>Tarelkin, Sergey A.</creatorcontrib><creatorcontrib>Kondakov, Mikhail N.</creatorcontrib><creatorcontrib>Shcherbachev, Kirill D.</creatorcontrib><creatorcontrib>Trifonova, Ekaterina V.</creatorcontrib><creatorcontrib>Drozdova, Taisia E.</creatorcontrib><creatorcontrib>Troschiev, Sergey Yu</creatorcontrib><creatorcontrib>Prikhodko, Dmitry D.</creatorcontrib><creatorcontrib>Glybin, Yury N.</creatorcontrib><creatorcontrib>Chubenko, Alexander P.</creatorcontrib><creatorcontrib>Britvich, Gennady I.</creatorcontrib><creatorcontrib>Kiselev, Dmitry A.</creatorcontrib><creatorcontrib>Polushin, Nikolay I.</creatorcontrib><creatorcontrib>Rabinovich, Oleg I.</creatorcontrib><creatorcontrib>Didenko, Sergey I.</creatorcontrib><title>High‐Pressure High‐Temperature Single‐Crystal Diamond Type IIa Characterization for Particle Detectors</title><title>Physica status solidi. A, Applications and materials science</title><description>Various samples of multisectoral high‐pressure high‐temperature (HPHT) single‐crystal diamond plate (IIa type) (4 × 4 × 0.53 mm) are tested for particle detection applications. The samples are investigated by X‐ray diffractometry, photoluminescence spectroscopy, Raman spectroscopy, Fourier‐transform infrared, and visible/ultraviolet (UV) absorption spectroscopy. High crystalline perfection and low impurity concentration (in the {100} growth sector) are observed. To investigate detector parameters, circular 1.0 and 1.5 mm diameter Pt Schottky barrier contacts are created on {111} and {100} growth sectors. On the backside, a Pt contact (3.5 × 3.5 mm) is produced. The {100} growth sector is proved to be a high‐quality detector: the full width at half maximum energy resolution is 0.94% for the 5.489 MeV 226Ra α‐line at an operational bias of +500 V. Therefore, it is concluded that the HPHT material {100} growth sector is used for radiation detector production, whose quality is not worse than the chemical vapor deposition method or specially selected natural diamond detectors.
High‐pressure high‐temperature (HPHT) single‐crystal diamond {100} growth sector is used for radiation detector production, The photoluminescence spectroscopy method, X‐ray diffraction (XRD), Raman spectroscopy, Fourier‐transform infrared spectroscopy (FTIR), and visible/ultraviolet (UV) absorption are used for structural investigation. The quality of the grown material is not worse than that grown by the chemical vapor deposition method or specially selected natural diamond detectors.</description><subject>Chemical vapor deposition</subject><subject>diamond detectors</subject><subject>Diamonds</subject><subject>Energy resolution</subject><subject>high-pressure high-temperature diamonds</subject><subject>high-pressure high-temperature methods</subject><subject>multisectorial diamond plates</subject><subject>particle detectors</subject><subject>Photoluminescence</subject><subject>Radiation counters</subject><subject>Radiation detectors</subject><subject>Radium 226</subject><subject>Raman spectroscopy</subject><subject>Sensors</subject><subject>single-crystal diamond</subject><subject>Spectrum analysis</subject><issn>1862-6300</issn><issn>1862-6319</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2020</creationdate><recordtype>article</recordtype><recordid>eNqFkE9PwkAQxTdGExG9em7iGZz9Q7c9kqJCQiIJeN5s2yksKW3dXWLqyY_gZ_STWALBo6eZeXlvXvIj5J7CkAKwx8Y5PWRAY4Aoii5Ij0YhG4ScxpfnHeCa3Di3BRAjIWmPlFOz3vx8fS8sOre3GJzuFe4atNofpKWp1iV2YmJb53UZTIze1VUerNoGg9lMB8lGW515tOZTe1NXQVHbYKGtN1mJwQQ9Zr627pZcFbp0eHeaffL2_LRKpoP568ssGc8HmWAQDUSIlPJRmlOWxgWTIJmgo1RK0JpHYcxBIs3COGQgZS64QMhBRIxRmqNMGe-Th-Pfxtbve3Rebeu9rbpKxXgsZEgF451reHRltnbOYqEaa3batoqCOhBVB6LqTLQLxMfAhymx_cetFsvl-C_7C7-rfRQ</recordid><startdate>202004</startdate><enddate>202004</enddate><creator>Chernykh, Sergey V.</creator><creator>Chernykh, Alexey V.</creator><creator>Tarelkin, Sergey A.</creator><creator>Kondakov, Mikhail N.</creator><creator>Shcherbachev, Kirill D.</creator><creator>Trifonova, Ekaterina V.</creator><creator>Drozdova, Taisia E.</creator><creator>Troschiev, Sergey Yu</creator><creator>Prikhodko, Dmitry D.</creator><creator>Glybin, Yury N.</creator><creator>Chubenko, Alexander P.</creator><creator>Britvich, Gennady I.</creator><creator>Kiselev, Dmitry A.</creator><creator>Polushin, Nikolay I.</creator><creator>Rabinovich, Oleg I.</creator><creator>Didenko, Sergey I.</creator><general>Wiley Subscription Services, Inc</general><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>7SR</scope><scope>7U5</scope><scope>8BQ</scope><scope>8FD</scope><scope>JG9</scope><scope>L7M</scope><orcidid>https://orcid.org/0000-0002-9164-6186</orcidid></search><sort><creationdate>202004</creationdate><title>High‐Pressure High‐Temperature Single‐Crystal Diamond Type IIa Characterization for Particle Detectors</title><author>Chernykh, Sergey V. ; Chernykh, Alexey V. ; Tarelkin, Sergey A. ; Kondakov, Mikhail N. ; Shcherbachev, Kirill D. ; Trifonova, Ekaterina V. ; Drozdova, Taisia E. ; Troschiev, Sergey Yu ; Prikhodko, Dmitry D. ; Glybin, Yury N. ; Chubenko, Alexander P. ; Britvich, Gennady I. ; Kiselev, Dmitry A. ; Polushin, Nikolay I. ; Rabinovich, Oleg I. ; Didenko, Sergey I.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c4208-46e1135bd12b9f27072415b770aa3869307e1c6962077d434e0d0482211de7b23</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2020</creationdate><topic>Chemical vapor deposition</topic><topic>diamond detectors</topic><topic>Diamonds</topic><topic>Energy resolution</topic><topic>high-pressure high-temperature diamonds</topic><topic>high-pressure high-temperature methods</topic><topic>multisectorial diamond plates</topic><topic>particle detectors</topic><topic>Photoluminescence</topic><topic>Radiation counters</topic><topic>Radiation detectors</topic><topic>Radium 226</topic><topic>Raman spectroscopy</topic><topic>Sensors</topic><topic>single-crystal diamond</topic><topic>Spectrum analysis</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Chernykh, Sergey V.</creatorcontrib><creatorcontrib>Chernykh, Alexey V.</creatorcontrib><creatorcontrib>Tarelkin, Sergey A.</creatorcontrib><creatorcontrib>Kondakov, Mikhail N.</creatorcontrib><creatorcontrib>Shcherbachev, Kirill D.</creatorcontrib><creatorcontrib>Trifonova, Ekaterina V.</creatorcontrib><creatorcontrib>Drozdova, Taisia E.</creatorcontrib><creatorcontrib>Troschiev, Sergey Yu</creatorcontrib><creatorcontrib>Prikhodko, Dmitry D.</creatorcontrib><creatorcontrib>Glybin, Yury N.</creatorcontrib><creatorcontrib>Chubenko, Alexander P.</creatorcontrib><creatorcontrib>Britvich, Gennady I.</creatorcontrib><creatorcontrib>Kiselev, Dmitry A.</creatorcontrib><creatorcontrib>Polushin, Nikolay I.</creatorcontrib><creatorcontrib>Rabinovich, Oleg I.</creatorcontrib><creatorcontrib>Didenko, Sergey I.</creatorcontrib><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Engineered Materials Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>Materials Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Physica status solidi. A, Applications and materials science</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Chernykh, Sergey V.</au><au>Chernykh, Alexey V.</au><au>Tarelkin, Sergey A.</au><au>Kondakov, Mikhail N.</au><au>Shcherbachev, Kirill D.</au><au>Trifonova, Ekaterina V.</au><au>Drozdova, Taisia E.</au><au>Troschiev, Sergey Yu</au><au>Prikhodko, Dmitry D.</au><au>Glybin, Yury N.</au><au>Chubenko, Alexander P.</au><au>Britvich, Gennady I.</au><au>Kiselev, Dmitry A.</au><au>Polushin, Nikolay I.</au><au>Rabinovich, Oleg I.</au><au>Didenko, Sergey I.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>High‐Pressure High‐Temperature Single‐Crystal Diamond Type IIa Characterization for Particle Detectors</atitle><jtitle>Physica status solidi. A, Applications and materials science</jtitle><date>2020-04</date><risdate>2020</risdate><volume>217</volume><issue>8</issue><epage>n/a</epage><issn>1862-6300</issn><eissn>1862-6319</eissn><abstract>Various samples of multisectoral high‐pressure high‐temperature (HPHT) single‐crystal diamond plate (IIa type) (4 × 4 × 0.53 mm) are tested for particle detection applications. The samples are investigated by X‐ray diffractometry, photoluminescence spectroscopy, Raman spectroscopy, Fourier‐transform infrared, and visible/ultraviolet (UV) absorption spectroscopy. High crystalline perfection and low impurity concentration (in the {100} growth sector) are observed. To investigate detector parameters, circular 1.0 and 1.5 mm diameter Pt Schottky barrier contacts are created on {111} and {100} growth sectors. On the backside, a Pt contact (3.5 × 3.5 mm) is produced. The {100} growth sector is proved to be a high‐quality detector: the full width at half maximum energy resolution is 0.94% for the 5.489 MeV 226Ra α‐line at an operational bias of +500 V. Therefore, it is concluded that the HPHT material {100} growth sector is used for radiation detector production, whose quality is not worse than the chemical vapor deposition method or specially selected natural diamond detectors.
High‐pressure high‐temperature (HPHT) single‐crystal diamond {100} growth sector is used for radiation detector production, The photoluminescence spectroscopy method, X‐ray diffraction (XRD), Raman spectroscopy, Fourier‐transform infrared spectroscopy (FTIR), and visible/ultraviolet (UV) absorption are used for structural investigation. The quality of the grown material is not worse than that grown by the chemical vapor deposition method or specially selected natural diamond detectors.</abstract><cop>Weinheim</cop><pub>Wiley Subscription Services, Inc</pub><doi>10.1002/pssa.201900888</doi><tpages>8</tpages><orcidid>https://orcid.org/0000-0002-9164-6186</orcidid></addata></record> |
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subjects | Chemical vapor deposition diamond detectors Diamonds Energy resolution high-pressure high-temperature diamonds high-pressure high-temperature methods multisectorial diamond plates particle detectors Photoluminescence Radiation counters Radiation detectors Radium 226 Raman spectroscopy Sensors single-crystal diamond Spectrum analysis |
title | High‐Pressure High‐Temperature Single‐Crystal Diamond Type IIa Characterization for Particle Detectors |
url | http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-23T10%3A05%3A24IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=High%E2%80%90Pressure%20High%E2%80%90Temperature%20Single%E2%80%90Crystal%20Diamond%20Type%20IIa%20Characterization%20for%20Particle%20Detectors&rft.jtitle=Physica%20status%20solidi.%20A,%20Applications%20and%20materials%20science&rft.au=Chernykh,%20Sergey%20V.&rft.date=2020-04&rft.volume=217&rft.issue=8&rft.epage=n/a&rft.issn=1862-6300&rft.eissn=1862-6319&rft_id=info:doi/10.1002/pssa.201900888&rft_dat=%3Cproquest_cross%3E2394761423%3C/proquest_cross%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-c4208-46e1135bd12b9f27072415b770aa3869307e1c6962077d434e0d0482211de7b23%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_pqid=2394761423&rft_id=info:pmid/&rfr_iscdi=true |