Microfocus X-Ray Method for Detecting Hidden Defects in Seeds of Woody Forest Species and Other Types of Vascular Plants

Modern hardware solutions used to obtain digital X-ray images of seeds are characterized. The main visualization methods and techniques for analyzing digital X-ray images of seeds are described. We revealed and assessed hidden defects of seed samples of the studied species such as Siberian cedar pin...

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Bibliographic Details
Published in:Technical physics 2020-02, Vol.65 (2), p.324-332
Main Authors: Arkhipov, M. V., Priyatkin, N. S., Gusakova, L. P., Karamysheva, A. V., Trofimuk, L. P., Potrakhov, N. N., Bessonov, V. B., Shchukina, P. A.
Format: Article
Language:English
Subjects:
Cedar
Classical and Continuum Physics
Crystal defects
Diffraction
Diffraction patterns
Digital imaging
Germination
Indicators
Methods
Nondestructive testing
Peppers
Physics
Physics and Astronomy
Physics—Life Sciences
Pine
Radiography
Seeds
X-ray radiography
X-rays
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Summary:Modern hardware solutions used to obtain digital X-ray images of seeds are characterized. The main visualization methods and techniques for analyzing digital X-ray images of seeds are described. We revealed and assessed hidden defects of seed samples of the studied species such as Siberian cedar pine ( Pinus sibirica Du Tour), Korean cedar pine ( P. koraiensis Siebold & Zucc.), sugar corn ( Zea mays L.), cucumber ( Cucumis sativum L.), and pepper ( Capsicum annuum L.) by microfocus X-ray radiography in combination with automatic analysis of digital X-ray images. Empty-grain and partially full-grain seeds have lower values of the “average brightness” of X-ray diffraction patterns. A comparative assessment of X-ray indicators and germination capacity of seedlings as integrated indicators for assessing the biological usefulness of seeds is performed.
ISSN:1063-7842
1090-6525
DOI:10.1134/S1063784220020024