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EBSD-Based Microscopy: Resolution of Dislocation Density

Consideration is given to the resolution of dislocation density afforded by EBSD-based scanning electron microscopy. Comparison between the conventional Hough- and the emerging high-resolution cross-correlation-based approaches is made. It is illustrated that considerable care must be exercised in s...

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Bibliographic Details
Published in:Computers, materials & continua materials & continua, 2009-12, Vol.14 (3), p.185
Main Authors: Adams, Brent L, Kacher, Joshua
Format: Article
Language:English
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Summary:Consideration is given to the resolution of dislocation density afforded by EBSD-based scanning electron microscopy. Comparison between the conventional Hough- and the emerging high-resolution cross-correlation-based approaches is made. It is illustrated that considerable care must be exercised in selecting a step size (Burger's circuit size) for experimental measurements. Important variables affecting this selection include the dislocation density and the physical size and density of dislocation dipole and multi-pole components of the structure. It is also illustrated that simulations can be useful to the interpretation of experimental recoveries.
ISSN:1546-2218
1546-2226
DOI:10.3970/cmc.2009.014.185