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EBSD-Based Microscopy: Resolution of Dislocation Density
Consideration is given to the resolution of dislocation density afforded by EBSD-based scanning electron microscopy. Comparison between the conventional Hough- and the emerging high-resolution cross-correlation-based approaches is made. It is illustrated that considerable care must be exercised in s...
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Published in: | Computers, materials & continua materials & continua, 2009-12, Vol.14 (3), p.185 |
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Main Authors: | , |
Format: | Article |
Language: | English |
Subjects: | |
Online Access: | Get full text |
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Summary: | Consideration is given to the resolution of dislocation density afforded by EBSD-based scanning electron microscopy. Comparison between the conventional Hough- and the emerging high-resolution cross-correlation-based approaches is made. It is illustrated that considerable care must be exercised in selecting a step size (Burger's circuit size) for experimental measurements. Important variables affecting this selection include the dislocation density and the physical size and density of dislocation dipole and multi-pole components of the structure. It is also illustrated that simulations can be useful to the interpretation of experimental recoveries. |
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ISSN: | 1546-2218 1546-2226 |
DOI: | 10.3970/cmc.2009.014.185 |