Effect of Si on the Growth Behavior of the Fe2Al5 Phase at Al-xSi(liquid)/Fe(solid) Interface During Holding by In-Situ Synchrotron Radiography

Effect of Si on the growth behavior of the Fe 2 Al 5 phase formed at the Al- x Si (liquid) /Fe (solid) interface during holding was investigated by a synchrotron radiation real-time imaging technique. Results show that growth of the Fe 2 Al 5 phase is accompanied by its simultaneous dissolution into...

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Bibliographic Details
Published in:Metallurgical and materials transactions. A, Physical metallurgy and materials science Physical metallurgy and materials science, 2020-06, Vol.51 (6), p.2711-2718
Main Authors: Zhang, Naifang, Hu, Qiaodan, Yang, Fan, Lu, Wenquan, Ding, Zongye, Cao, Sheng, Yu, Liao, Ge, Xuan, Li, Jianguo
Format: Article
Language:English
Subjects:
Aluminum
Characterization and Evaluation of Materials
Chemistry and Materials Science
Communication
Dissolution
Imaging techniques
Iron
Materials Science
Metallic Materials
Morphology
Nanotechnology
Radiography
Silicon
Structural Materials
Surfaces and Interfaces
Synchrotron radiation
Thin Films
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Summary:Effect of Si on the growth behavior of the Fe 2 Al 5 phase formed at the Al- x Si (liquid) /Fe (solid) interface during holding was investigated by a synchrotron radiation real-time imaging technique. Results show that growth of the Fe 2 Al 5 phase is accompanied by its simultaneous dissolution into the melt. Addition of Si inhibits the growth of Fe 2 Al 5 to reduce its thickness and change its morphology. The growth and dissolution kinetics of the Fe 2 Al 5 phase are discussed.
ISSN:1073-5623
1543-1940
DOI:10.1007/s11661-020-05754-9