Measurement of the Complex Dielectric Constant of Materials Based on a Ridge Waveguide

—The problem of determining the complex dielectric constant of materials in the centimeter and millimeter wavelength ranges is solved using the waveguide method with an double-ridged waveguide. The use of a segment of an double-ridged waveguide as the measuring cell made it possible to expand the op...

Full description

Saved in:
Bibliographic Details
Published in:Journal of communications technology & electronics 2020-05, Vol.65 (5), p.465-471
Main Authors: Donchenko, A. V., Zargano, G. F., Zemlyakov, V. V., Kleschenkov, A. B.
Format: Article
Language:English
Subjects:
Communications Engineering
Ebonite
Electric properties
Electrodynamics and Wave Propagation
Electromagnetic fields
Electromagnetism
Engineering
Fiberglass
Frequency ranges
Measurement
Networks
Permittivity
Polytetrafluoroethylene
Ridges
Waveguides
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:—The problem of determining the complex dielectric constant of materials in the centimeter and millimeter wavelength ranges is solved using the waveguide method with an double-ridged waveguide. The use of a segment of an double-ridged waveguide as the measuring cell made it possible to expand the operating frequency range and increase the measurement accuracy due to localization of the electromagnetic field energy in the space between metal ridges. The electromagnetic fields of hybrid types of waves in the double-ridged waveguide were calculated by the partial region method taking into account the peculiarities of the electromagnetic field on the metal and dielectric ridges. The results of measuring the complex dielectric constant for samples made of ebonite, Teflon, and fiberglass are presented.
ISSN:1064-2269
1555-6557
DOI:10.1134/S1064226920050022