Loading…
Measurement of the Complex Dielectric Constant of Materials Based on a Ridge Waveguide
—The problem of determining the complex dielectric constant of materials in the centimeter and millimeter wavelength ranges is solved using the waveguide method with an double-ridged waveguide. The use of a segment of an double-ridged waveguide as the measuring cell made it possible to expand the op...
Saved in:
Published in: | Journal of communications technology & electronics 2020-05, Vol.65 (5), p.465-471 |
---|---|
Main Authors: | , , , |
Format: | Article |
Language: | English |
Subjects: | |
Citations: | Items that this one cites Items that cite this one |
Online Access: | Get full text |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
cited_by | cdi_FETCH-LOGICAL-c457t-54312c043516109a2fb81c60b98a85326d710ca3c6ffe5818ccab071dc1b809e3 |
---|---|
cites | cdi_FETCH-LOGICAL-c457t-54312c043516109a2fb81c60b98a85326d710ca3c6ffe5818ccab071dc1b809e3 |
container_end_page | 471 |
container_issue | 5 |
container_start_page | 465 |
container_title | Journal of communications technology & electronics |
container_volume | 65 |
creator | Donchenko, A. V. Zargano, G. F. Zemlyakov, V. V. Kleschenkov, A. B. |
description | —The problem of determining the complex dielectric constant of materials in the centimeter and millimeter wavelength ranges is solved using the waveguide method with an double-ridged waveguide. The use of a segment of an double-ridged waveguide as the measuring cell made it possible to expand the operating frequency range and increase the measurement accuracy due to localization of the electromagnetic field energy in the space between metal ridges. The electromagnetic fields of hybrid types of waves in the double-ridged waveguide were calculated by the partial region method taking into account the peculiarities of the electromagnetic field on the metal and dielectric ridges. The results of measuring the complex dielectric constant for samples made of ebonite, Teflon, and fiberglass are presented. |
doi_str_mv | 10.1134/S1064226920050022 |
format | article |
fullrecord | <record><control><sourceid>gale_proqu</sourceid><recordid>TN_cdi_proquest_journals_2406648694</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><galeid>A624898419</galeid><sourcerecordid>A624898419</sourcerecordid><originalsourceid>FETCH-LOGICAL-c457t-54312c043516109a2fb81c60b98a85326d710ca3c6ffe5818ccab071dc1b809e3</originalsourceid><addsrcrecordid>eNp10VtLBCEUB_AhCrp-gN6EIAiaOjrqOo-13RaKoO3yODjOmcnYndnUifr2GRPUEiGonPP7K2iS7FI4ojTjx1MKkjMmcwYgABhbSTaoECKVQoxW4z6206_-erLp_QtAlkvINpLHG9S-dzjHNpCuJuEZybibL2b4Ts4sztAEZ00stT7ogdzogM7qmSen2mNFupZocmerBsmTfsOmtxVuJ2t1FLjzvW4lDxfn9-Or9Pr2cjI-uU4NF6OQCp5RZoBngkoKuWZ1qaiRUOZKK5ExWY0oGJ0ZWdcoFFXG6BJGtDK0VJBjtpXsDecuXPfaow_FS9e7Nl5ZMA5SciVzHtXRoBo9w8K2dRecNnFUOLema7G2sX4iGVe54jSPgf2lQDQB30Oje--LZXjwP5xM75bt4S9b9t626OPkbfMc_BBZ4nTgxnXeO6yLhbNz7T4KCsXXnxd__jxm2JDx0bYNup_n-D_0Ce-DqcE</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>2406648694</pqid></control><display><type>article</type><title>Measurement of the Complex Dielectric Constant of Materials Based on a Ridge Waveguide</title><source>Springer Link</source><creator>Donchenko, A. V. ; Zargano, G. F. ; Zemlyakov, V. V. ; Kleschenkov, A. B.</creator><creatorcontrib>Donchenko, A. V. ; Zargano, G. F. ; Zemlyakov, V. V. ; Kleschenkov, A. B.</creatorcontrib><description>—The problem of determining the complex dielectric constant of materials in the centimeter and millimeter wavelength ranges is solved using the waveguide method with an double-ridged waveguide. The use of a segment of an double-ridged waveguide as the measuring cell made it possible to expand the operating frequency range and increase the measurement accuracy due to localization of the electromagnetic field energy in the space between metal ridges. The electromagnetic fields of hybrid types of waves in the double-ridged waveguide were calculated by the partial region method taking into account the peculiarities of the electromagnetic field on the metal and dielectric ridges. The results of measuring the complex dielectric constant for samples made of ebonite, Teflon, and fiberglass are presented.</description><identifier>ISSN: 1064-2269</identifier><identifier>EISSN: 1555-6557</identifier><identifier>DOI: 10.1134/S1064226920050022</identifier><language>eng</language><publisher>Moscow: Pleiades Publishing</publisher><subject>Communications Engineering ; Ebonite ; Electric properties ; Electrodynamics and Wave Propagation ; Electromagnetic fields ; Electromagnetism ; Engineering ; Fiberglass ; Frequency ranges ; Measurement ; Networks ; Permittivity ; Polytetrafluoroethylene ; Ridges ; Waveguides</subject><ispartof>Journal of communications technology & electronics, 2020-05, Vol.65 (5), p.465-471</ispartof><rights>Pleiades Publishing, Inc. 2020</rights><rights>COPYRIGHT 2020 Springer</rights><rights>Pleiades Publishing, Inc. 2020.</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c457t-54312c043516109a2fb81c60b98a85326d710ca3c6ffe5818ccab071dc1b809e3</citedby><cites>FETCH-LOGICAL-c457t-54312c043516109a2fb81c60b98a85326d710ca3c6ffe5818ccab071dc1b809e3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,780,784,27924,27925</link.rule.ids></links><search><creatorcontrib>Donchenko, A. V.</creatorcontrib><creatorcontrib>Zargano, G. F.</creatorcontrib><creatorcontrib>Zemlyakov, V. V.</creatorcontrib><creatorcontrib>Kleschenkov, A. B.</creatorcontrib><title>Measurement of the Complex Dielectric Constant of Materials Based on a Ridge Waveguide</title><title>Journal of communications technology & electronics</title><addtitle>J. Commun. Technol. Electron</addtitle><description>—The problem of determining the complex dielectric constant of materials in the centimeter and millimeter wavelength ranges is solved using the waveguide method with an double-ridged waveguide. The use of a segment of an double-ridged waveguide as the measuring cell made it possible to expand the operating frequency range and increase the measurement accuracy due to localization of the electromagnetic field energy in the space between metal ridges. The electromagnetic fields of hybrid types of waves in the double-ridged waveguide were calculated by the partial region method taking into account the peculiarities of the electromagnetic field on the metal and dielectric ridges. The results of measuring the complex dielectric constant for samples made of ebonite, Teflon, and fiberglass are presented.</description><subject>Communications Engineering</subject><subject>Ebonite</subject><subject>Electric properties</subject><subject>Electrodynamics and Wave Propagation</subject><subject>Electromagnetic fields</subject><subject>Electromagnetism</subject><subject>Engineering</subject><subject>Fiberglass</subject><subject>Frequency ranges</subject><subject>Measurement</subject><subject>Networks</subject><subject>Permittivity</subject><subject>Polytetrafluoroethylene</subject><subject>Ridges</subject><subject>Waveguides</subject><issn>1064-2269</issn><issn>1555-6557</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2020</creationdate><recordtype>article</recordtype><recordid>eNp10VtLBCEUB_AhCrp-gN6EIAiaOjrqOo-13RaKoO3yODjOmcnYndnUifr2GRPUEiGonPP7K2iS7FI4ojTjx1MKkjMmcwYgABhbSTaoECKVQoxW4z6206_-erLp_QtAlkvINpLHG9S-dzjHNpCuJuEZybibL2b4Ts4sztAEZ00stT7ogdzogM7qmSen2mNFupZocmerBsmTfsOmtxVuJ2t1FLjzvW4lDxfn9-Or9Pr2cjI-uU4NF6OQCp5RZoBngkoKuWZ1qaiRUOZKK5ExWY0oGJ0ZWdcoFFXG6BJGtDK0VJBjtpXsDecuXPfaow_FS9e7Nl5ZMA5SciVzHtXRoBo9w8K2dRecNnFUOLema7G2sX4iGVe54jSPgf2lQDQB30Oje--LZXjwP5xM75bt4S9b9t626OPkbfMc_BBZ4nTgxnXeO6yLhbNz7T4KCsXXnxd__jxm2JDx0bYNup_n-D_0Ce-DqcE</recordid><startdate>20200501</startdate><enddate>20200501</enddate><creator>Donchenko, A. V.</creator><creator>Zargano, G. F.</creator><creator>Zemlyakov, V. V.</creator><creator>Kleschenkov, A. B.</creator><general>Pleiades Publishing</general><general>Springer</general><general>Springer Nature B.V</general><scope>AAYXX</scope><scope>CITATION</scope><scope>N95</scope><scope>XI7</scope><scope>ISR</scope><scope>7SP</scope><scope>8FD</scope><scope>L7M</scope></search><sort><creationdate>20200501</creationdate><title>Measurement of the Complex Dielectric Constant of Materials Based on a Ridge Waveguide</title><author>Donchenko, A. V. ; Zargano, G. F. ; Zemlyakov, V. V. ; Kleschenkov, A. B.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c457t-54312c043516109a2fb81c60b98a85326d710ca3c6ffe5818ccab071dc1b809e3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2020</creationdate><topic>Communications Engineering</topic><topic>Ebonite</topic><topic>Electric properties</topic><topic>Electrodynamics and Wave Propagation</topic><topic>Electromagnetic fields</topic><topic>Electromagnetism</topic><topic>Engineering</topic><topic>Fiberglass</topic><topic>Frequency ranges</topic><topic>Measurement</topic><topic>Networks</topic><topic>Permittivity</topic><topic>Polytetrafluoroethylene</topic><topic>Ridges</topic><topic>Waveguides</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Donchenko, A. V.</creatorcontrib><creatorcontrib>Zargano, G. F.</creatorcontrib><creatorcontrib>Zemlyakov, V. V.</creatorcontrib><creatorcontrib>Kleschenkov, A. B.</creatorcontrib><collection>CrossRef</collection><collection>Gale Business: Insights (formerly Business Insights: Global)</collection><collection>Business Insights: Essentials</collection><collection>Science in Context</collection><collection>Electronics & Communications Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Journal of communications technology & electronics</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Donchenko, A. V.</au><au>Zargano, G. F.</au><au>Zemlyakov, V. V.</au><au>Kleschenkov, A. B.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Measurement of the Complex Dielectric Constant of Materials Based on a Ridge Waveguide</atitle><jtitle>Journal of communications technology & electronics</jtitle><stitle>J. Commun. Technol. Electron</stitle><date>2020-05-01</date><risdate>2020</risdate><volume>65</volume><issue>5</issue><spage>465</spage><epage>471</epage><pages>465-471</pages><issn>1064-2269</issn><eissn>1555-6557</eissn><abstract>—The problem of determining the complex dielectric constant of materials in the centimeter and millimeter wavelength ranges is solved using the waveguide method with an double-ridged waveguide. The use of a segment of an double-ridged waveguide as the measuring cell made it possible to expand the operating frequency range and increase the measurement accuracy due to localization of the electromagnetic field energy in the space between metal ridges. The electromagnetic fields of hybrid types of waves in the double-ridged waveguide were calculated by the partial region method taking into account the peculiarities of the electromagnetic field on the metal and dielectric ridges. The results of measuring the complex dielectric constant for samples made of ebonite, Teflon, and fiberglass are presented.</abstract><cop>Moscow</cop><pub>Pleiades Publishing</pub><doi>10.1134/S1064226920050022</doi><tpages>7</tpages></addata></record> |
fulltext | fulltext |
identifier | ISSN: 1064-2269 |
ispartof | Journal of communications technology & electronics, 2020-05, Vol.65 (5), p.465-471 |
issn | 1064-2269 1555-6557 |
language | eng |
recordid | cdi_proquest_journals_2406648694 |
source | Springer Link |
subjects | Communications Engineering Ebonite Electric properties Electrodynamics and Wave Propagation Electromagnetic fields Electromagnetism Engineering Fiberglass Frequency ranges Measurement Networks Permittivity Polytetrafluoroethylene Ridges Waveguides |
title | Measurement of the Complex Dielectric Constant of Materials Based on a Ridge Waveguide |
url | http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-23T19%3A14%3A33IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-gale_proqu&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Measurement%20of%20the%20Complex%20Dielectric%20Constant%20of%20Materials%20Based%20on%20a%20Ridge%20Waveguide&rft.jtitle=Journal%20of%20communications%20technology%20&%20electronics&rft.au=Donchenko,%20A.%20V.&rft.date=2020-05-01&rft.volume=65&rft.issue=5&rft.spage=465&rft.epage=471&rft.pages=465-471&rft.issn=1064-2269&rft.eissn=1555-6557&rft_id=info:doi/10.1134/S1064226920050022&rft_dat=%3Cgale_proqu%3EA624898419%3C/gale_proqu%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-c457t-54312c043516109a2fb81c60b98a85326d710ca3c6ffe5818ccab071dc1b809e3%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_pqid=2406648694&rft_id=info:pmid/&rft_galeid=A624898419&rfr_iscdi=true |