Nonlinear Optical Diagnostics of Thin Polycrystalline Lead Zirconate Titanate Films

Nonlinear optical microscopy techniques have been used to study thin films of single-phase (perovskite) and two-phase (perovskite–pyrochlore) lead zirconate titanate (PZT) deposited on Pt/TiO 2 /SiO 2 /Si by means of radio-frequency magnetron sputtering at various target–substrate distances ( D = 30...

Full description

Saved in:
Bibliographic Details
Published in:Technical physics letters 2020-04, Vol.46 (4), p.385-388
Main Authors: Elshin, A. S., Pronin, I. P., Senkevich, S. V., Mishina, E. D.
Format: Article
Language:English
Subjects:
Classical and Continuum Physics
Lead zirconate titanates
Magnetron sputtering
Nonlinear optics
Optical microscopy
Perovskites
Physics
Physics and Astronomy
Second harmonic generation
Silicon dioxide
Stress concentration
Substrates
Thin films
Titanium dioxide
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:Nonlinear optical microscopy techniques have been used to study thin films of single-phase (perovskite) and two-phase (perovskite–pyrochlore) lead zirconate titanate (PZT) deposited on Pt/TiO 2 /SiO 2 /Si by means of radio-frequency magnetron sputtering at various target–substrate distances ( D = 30–70 mm). Results revealed inhomogeneous distribution of second-harmonic generation in spherulitic perovskite islands, including increased signal intensity at perovskite/pyrochlore interface, which may be related to a nonuniform distribution of mechanical stresses. Factors responsible for the observed strong variation in second-harmonic signal are discussed, including the mutual relationship between changes in the character of spherulitic structure and conditions of PZT film deposition depending on the target–substrate distance.
ISSN:1063-7850
1090-6533
DOI:10.1134/S1063785020040215