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Controllable Functional Layer and Temperature-Dependent Characteristic in Niobium Oxide Insulator-Metal Transition Selector
The niobium oxide insulator-metal transition selector device is considered to be a rectifying device with great potential. However, the lack of research on the experimental parameters and the complex physical mechanism of the NbO 2 device seriously affected its development. In this article, a contro...
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Published in: | IEEE transactions on electron devices 2020-07, Vol.67 (7), p.2771-2777 |
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Main Authors: | , , , , , , , |
Format: | Article |
Language: | English |
Subjects: | |
Citations: | Items that this one cites Items that cite this one |
Online Access: | Get full text |
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Summary: | The niobium oxide insulator-metal transition selector device is considered to be a rectifying device with great potential. However, the lack of research on the experimental parameters and the complex physical mechanism of the NbO 2 device seriously affected its development. In this article, a controllable intermediate functional layer of NbO x was reported in the Pt/NbO x /TiN device subjected to different forming compliance currents (FCCs) and compliance currents (CCs). The different FCCs and CCs changed the size of the Nb 2 O 5 and NbO 2 layers within the NbO x layer, which further affected the threshold voltage. The result helped to realize the control of the NbO x functional layer, which was also of great significance for the adjustment of the experimental parameters in the preparation experiment according to the required performance. Furthermore, the {I}-{V} characteristics and switching times at different ambient temperatures were carried out, showing the specific dependency of the device on temperature. Between them, the simulated switching time of 2 ns at room temperature proved that the selector had a great application prospect in high speed and high-density storage or logic switch. Generally, the whole research helped to improve the control of the interlayer structure and the performance of the device for application in 3-D crossbar arrays, and provided a valid model to study the device. |
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ISSN: | 0018-9383 1557-9646 |
DOI: | 10.1109/TED.2020.2993771 |