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Wafer-Level Characterization of Silicon Nitride CWDM (De)Multiplexers Using Bayesian Inference

A cascaded Mach-Zehnder interferometer based filter for coarse wavelength (de)multiplexing (CWDM) at the O-band is fabricated and tested on a silicon nitride on SOI platform. We characterize the chip-to-chip performance variability of the filter devices on a wafer. Using the optical measurement data...

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Published in:	IEEE photonics technology letters 2020-08, Vol.32 (15), p.917-920
Main Authors:	Ong, Jun Rong, Guo, Tina X., Ang, Thomas Y. L., Lim, Soon Thor, Wang, Hong, Png, Ching Eng
Format:	Article
Language:	English
Subjects:	Bayesian analysis Cultural differences Ecology Education Entertainment industry History Mach-Zehnder interferometers Multiplexers Multiplexing Optical measurement Parameter estimation Parameter uncertainty photonic integrated circuits Silicon nitride silicon photonics Statistical inference Technological innovation Waveguides wavelength division multiplexing
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description	A cascaded Mach-Zehnder interferometer based filter for coarse wavelength (de)multiplexing (CWDM) at the O-band is fabricated and tested on a silicon nitride on SOI platform. We characterize the chip-to-chip performance variability of the filter devices on a wafer. Using the optical measurement data, we apply Bayesian inference methods to estimate the waveguide geometery parameters and also quantify the uncertainty of the estimates.
doi_str_mv	10.1109/LPT.2020.3004850
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subjects	Bayesian analysis Cultural differences Ecology Education Entertainment industry History Mach-Zehnder interferometers Multiplexers Multiplexing Optical measurement Parameter estimation Parameter uncertainty photonic integrated circuits Silicon nitride silicon photonics Statistical inference Technological innovation Waveguides wavelength division multiplexing
title	Wafer-Level Characterization of Silicon Nitride CWDM (De)Multiplexers Using Bayesian Inference
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