Global planning of accelerated degradation tests based on exponential dispersion degradation models

The accelerated degradation test (ADT) is an efficient tool for assessing the lifetime information of highly reliable products. However, conducting an ADT is very expensive. Therefore, how to conduct a cost‐constrained ADT plan is a great challenging issue for reliability analysts. By taking the exp...

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Bibliographic Details
Published in:Naval research logistics 2020-09, Vol.67 (6), p.469-483
Main Authors: Lee, I‐Chen, Tseng, Sheng‐Tsaing, Hong, Yili
Format: Article
Language:English
Subjects:
accelerated degradation tests
Accelerated tests
Algorithms
Analytical methods
Cost analysis
cost constraints
Degradation
Dispersion
exponential dispersion degradation model
optimal design
Reliability analysis
Search algorithms
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Summary:The accelerated degradation test (ADT) is an efficient tool for assessing the lifetime information of highly reliable products. However, conducting an ADT is very expensive. Therefore, how to conduct a cost‐constrained ADT plan is a great challenging issue for reliability analysts. By taking the experimental cost into consideration, this paper proposes a semi‐analytical procedure to determine the total sample size, testing stress levels, the measurement frequencies, and the number of measurements (within a degradation path) globally under a class of exponential dispersion degradation models. The proposed method is also extended to determine the global planning of a three‐level compromise plan. The advantage of the proposed method not only provides better design insights for conducting an ADT plan, but also provides an efficient algorithm to obtain a cost‐constrained ADT plan, compared with conventional optimal plans by grid search algorithms.
ISSN:0894-069X
1520-6750
DOI:10.1002/nav.21923