Sintering Behavior and Microwave Dielectric Properties of Low-Permittivity SrMgSi2O6 Ceramic

• Published in: Journal of electronic materials 2020-10, Vol.49 (10), p.5989-5993
• Main Authors: Zhou, Xianjie, Zhou, Huanfu, Hu, Sang, Luan, Xiaowen, Deng, Jiji, Lu, Chengming, Li, Shixuan, Wang, Kuangguo, Chen, Xiuli
• Format: Article
• Language: English
• Subjects: Ceramics; Characterization and Evaluation of Materials; Chemistry and Materials Science; Dielectric properties; Diffraction patterns; Electronics and Microelectronics; Instrumentation; Materials Science; Morphology; Optical and Electronic Materials; Permittivity; Q factors; Sintering; Solid State Physics
• ISSN: 0361-5235; 1543-186X
• DOI: 10.1007/s11664-020-08327-z

Low-permittivity SrMgSi 2 O 6 microwave dielectric ceramics were synthesized via a conventional solid-state reaction method. Further, their sintering behavior as well as structural and microwave dielectric properties were studied. The x-ray diffraction patterns of the SrMgSi 2 O 6 and Sr 2 MgSi 2 O 7 ceramics were compared; both the samples were confirmed to be tetragonal. Meanwhile, the microwave dielectric properties of the samples were related to their microscopic morphology. In addition, the SrMgSi 2 O 6 ceramics had a low sintering temperature of 1125°C; they exhibited good microwave dielectric performances with a relative permittivity of ε r  = 6.7, a quality factor Q  ×  f  = 25,800 GHz, and temperature coefficient of the resonator frequency τ f  = −46 ppm/°C. Therefore, the ceramics exhibit potential for application in microwave devices.