High-speed TFT LCD defect-detection system with genetic algorithm

Purpose - The purpose of this research is to develop an automatic optical inspection system for thin film transistor (TFT) liquid crystal display (LCD).Design methodology approach - A new algorithm that accounts for the closing, opening, etching, dilating, and genetic method is used. It helps to cal...

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Bibliographic Details
Published in:Assembly automation 2008-01, Vol.28 (1), p.69-76
Main Authors: Lin, Chern-Sheng, Liao, Yo-Chang, Lay, Yun-Long, Lee, Kun-Chen, Yeh, Mau-Shiun
Format: Article
Language:English
Subjects:
Adjustment
Chromosomes
Crystal defects
Defects
Evolution
Genes
Genetic algorithms
Image processing systems
Inspection
Inspections
LCDs
Liquid crystal displays
Methods
Mutation
Parameters
Pattern recognition
Semiconductor devices
Studies
Thin film transistors
Transistors
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Summary:Purpose - The purpose of this research is to develop an automatic optical inspection system for thin film transistor (TFT) liquid crystal display (LCD).Design methodology approach - A new algorithm that accounts for the closing, opening, etching, dilating, and genetic method is used. It helps to calculate the location and rotation angle for transistor patterns precisely and quickly. The system can adjust inspection platform parameters according to viewed performance. The parameter adaptation occurs in parallel with running the genetic algorithm and imaging processing methods. The proposed method is compared with the algorithms that use artificial parameter sets.Findings - This system ensures high quality in an LCD production line. This multipurpose image-based measurement method uses unsophisticated and economical equipment, and it also detects defects in the micro-fabrication process.Originality value - The experiment's results show that the proposed method offers advantages over other competing methods.
ISSN:0144-5154
2754-6969
1758-4078
2754-6977
DOI:10.1108/01445150810849037