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A Film Bulk Acoustic Resonator Based on Ferroelectric Aluminum Scandium Nitride Films
This work reports on the first demonstration of the frequency tuning and intrinsic polarization switching of film bulk acoustic resonators (FBARs), based on sputtered AlScN piezoelectric thin films with Sc/(Al + Sc) ratio of approx. 30%. A box-like ferroelectric hysteresis behavior of 900 nm-thick A...
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Published in: | Journal of microelectromechanical systems 2020-10, Vol.29 (5), p.741-747 |
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description | This work reports on the first demonstration of the frequency tuning and intrinsic polarization switching of film bulk acoustic resonators (FBARs), based on sputtered AlScN piezoelectric thin films with Sc/(Al + Sc) ratio of approx. 30%. A box-like ferroelectric hysteresis behavior of 900 nm-thick Al 0.7 Sc 0.3 N sputtered films is obtained, showing a coercive electric field at ~3 MV/cm. The fundamental thickness-mode resonance of the bulk acoustic wave (BAW) resonator is measured at 3.17 GHz frequency with an excellent electromechanical coupling coefficient ( k_{t}^{2} ) of 18.1%. The FBAR frequency response is studied, in both (i) the linear tuning regime, upon application of DC electric fields below the coercive field; as well as (ii) the polarization switching regime, upon application of electric fields above the coercive field. A large linear tuning range of 215 ppm \times \,\,\mu \text{m} /V is obtained in case (i), resulting from the high scandium content. The series resonance frequency of the FBARs is switched ON and OFF in (ii) upon application of 350 V unipolar waveform across the Al 0.7 Sc 0.3 N thickness. This is the first demonstration of the intrinsically switchable AlN-based FBARs with a large tuning range; and record high k_{t}^{2} reported for AlN-based FBARs to date. Furthermore, this work paves the way for realization of tunable and switchable wideband acoustic filters operating at super high frequency ranges (SHF). [2020-0203] |
doi_str_mv | 10.1109/JMEMS.2020.3014584 |
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A box-like ferroelectric hysteresis behavior of 900 nm-thick Al 0.7 Sc 0.3 N sputtered films is obtained, showing a coercive electric field at ~3 MV/cm. The fundamental thickness-mode resonance of the bulk acoustic wave (BAW) resonator is measured at 3.17 GHz frequency with an excellent electromechanical coupling coefficient (<inline-formula> <tex-math notation="LaTeX">k_{t}^{2} </tex-math></inline-formula>) of 18.1%. The FBAR frequency response is studied, in both (i) the linear tuning regime, upon application of DC electric fields below the coercive field; as well as (ii) the polarization switching regime, upon application of electric fields above the coercive field. A large linear tuning range of 215 ppm <inline-formula> <tex-math notation="LaTeX">\times \,\,\mu \text{m} </tex-math></inline-formula>/V is obtained in case (i), resulting from the high scandium content. The series resonance frequency of the FBARs is switched ON and OFF in (ii) upon application of 350 V unipolar waveform across the Al 0.7 Sc 0.3 N thickness. This is the first demonstration of the intrinsically switchable AlN-based FBARs with a large tuning range; and record high <inline-formula> <tex-math notation="LaTeX">k_{t}^{2} </tex-math></inline-formula> reported for AlN-based FBARs to date. Furthermore, this work paves the way for realization of tunable and switchable wideband acoustic filters operating at super high frequency ranges (SHF). [2020-0203]]]></description><identifier>ISSN: 1057-7157</identifier><identifier>EISSN: 1941-0158</identifier><identifier>DOI: 10.1109/JMEMS.2020.3014584</identifier><identifier>CODEN: JMIYET</identifier><language>eng</language><publisher>New York: IEEE</publisher><subject>Acoustic resonance ; acoustic resonators ; Acoustic waves ; Acoustics ; Aluminum nitride ; aluminum scandium nitride ; Broadband ; Bulk acoustic wave devices ; Coercivity ; Coupling coefficients ; Electric fields ; Electric filters ; Etching ; fbar ; Ferroelectric ; Ferroelectric materials ; Ferroelectricity ; Film bulk acoustic resonators ; filters ; Frequency ranges ; Frequency response ; frequency tuning ; piezoelectric films ; Piezoelectricity ; Polarization ; Resonance ; Resonant frequency ; Resonators ; Scandium ; Superhigh frequencies ; Switches ; Switching ; Thickness ; Thin films ; Tuning ; Voltage measurement ; Waveforms</subject><ispartof>Journal of microelectromechanical systems, 2020-10, Vol.29 (5), p.741-747</ispartof><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2020</rights><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c339t-4b397bb253a1da8ee56dee48e106feeb4709ad28e82e1b871d90e1959bc4c76a3</citedby><cites>FETCH-LOGICAL-c339t-4b397bb253a1da8ee56dee48e106feeb4709ad28e82e1b871d90e1959bc4c76a3</cites><orcidid>0000-0002-4121-0982 ; 0000-0002-4539-7393 ; 0000-0001-9433-6370 ; 0000-0002-2839-553X</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/9169713$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,780,784,27923,27924,54795</link.rule.ids></links><search><creatorcontrib>Wang, Jialin</creatorcontrib><creatorcontrib>Park, Mingyo</creatorcontrib><creatorcontrib>Mertin, Stefan</creatorcontrib><creatorcontrib>Pensala, Tuomas</creatorcontrib><creatorcontrib>Ayazi, Farrokh</creatorcontrib><creatorcontrib>Ansari, Azadeh</creatorcontrib><title>A Film Bulk Acoustic Resonator Based on Ferroelectric Aluminum Scandium Nitride Films</title><title>Journal of microelectromechanical systems</title><addtitle>JMEMS</addtitle><description><![CDATA[This work reports on the first demonstration of the frequency tuning and intrinsic polarization switching of film bulk acoustic resonators (FBARs), based on sputtered AlScN piezoelectric thin films with Sc/(Al + Sc) ratio of approx. 30%. A box-like ferroelectric hysteresis behavior of 900 nm-thick Al 0.7 Sc 0.3 N sputtered films is obtained, showing a coercive electric field at ~3 MV/cm. The fundamental thickness-mode resonance of the bulk acoustic wave (BAW) resonator is measured at 3.17 GHz frequency with an excellent electromechanical coupling coefficient (<inline-formula> <tex-math notation="LaTeX">k_{t}^{2} </tex-math></inline-formula>) of 18.1%. The FBAR frequency response is studied, in both (i) the linear tuning regime, upon application of DC electric fields below the coercive field; as well as (ii) the polarization switching regime, upon application of electric fields above the coercive field. A large linear tuning range of 215 ppm <inline-formula> <tex-math notation="LaTeX">\times \,\,\mu \text{m} </tex-math></inline-formula>/V is obtained in case (i), resulting from the high scandium content. The series resonance frequency of the FBARs is switched ON and OFF in (ii) upon application of 350 V unipolar waveform across the Al 0.7 Sc 0.3 N thickness. This is the first demonstration of the intrinsically switchable AlN-based FBARs with a large tuning range; and record high <inline-formula> <tex-math notation="LaTeX">k_{t}^{2} </tex-math></inline-formula> reported for AlN-based FBARs to date. Furthermore, this work paves the way for realization of tunable and switchable wideband acoustic filters operating at super high frequency ranges (SHF). [2020-0203]]]></description><subject>Acoustic resonance</subject><subject>acoustic resonators</subject><subject>Acoustic waves</subject><subject>Acoustics</subject><subject>Aluminum nitride</subject><subject>aluminum scandium nitride</subject><subject>Broadband</subject><subject>Bulk acoustic wave devices</subject><subject>Coercivity</subject><subject>Coupling coefficients</subject><subject>Electric fields</subject><subject>Electric filters</subject><subject>Etching</subject><subject>fbar</subject><subject>Ferroelectric</subject><subject>Ferroelectric materials</subject><subject>Ferroelectricity</subject><subject>Film bulk acoustic resonators</subject><subject>filters</subject><subject>Frequency ranges</subject><subject>Frequency response</subject><subject>frequency tuning</subject><subject>piezoelectric films</subject><subject>Piezoelectricity</subject><subject>Polarization</subject><subject>Resonance</subject><subject>Resonant frequency</subject><subject>Resonators</subject><subject>Scandium</subject><subject>Superhigh frequencies</subject><subject>Switches</subject><subject>Switching</subject><subject>Thickness</subject><subject>Thin films</subject><subject>Tuning</subject><subject>Voltage measurement</subject><subject>Waveforms</subject><issn>1057-7157</issn><issn>1941-0158</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2020</creationdate><recordtype>article</recordtype><recordid>eNo9kMtOwzAQRS0EEqXwA7CJxDrFYzuxvUyrlodakChdR04ylVKSuNjJgr_HfYjVXGnOnZEOIfdAJwBUP72t5qv1hFFGJ5yCSJS4ICPQAmIKiboMmSYylpDIa3Lj_Y4GSKh0RDZZtKibNpoOzXeUlXbwfV1Gn-htZ3rroqnxWEW2ixbonMUGy94FIGuGtu6GNlqXpqvqEN7rsKjweM3fkqutaTzeneeYbBbzr9lLvPx4fp1ly7jkXPexKLiWRcESbqAyCjFJK0ShEGi6RSyEpNpUTKFiCIWSUGmKoBNdlKKUqeFj8ni6u3f2Z0Df5zs7uC68zJkQmlMNigWKnajSWe8dbvO9q1vjfnOg-UFfftSXH_TlZ32h9HAq1Yj4X9CQagmc_wHz3Wu5</recordid><startdate>20201001</startdate><enddate>20201001</enddate><creator>Wang, Jialin</creator><creator>Park, Mingyo</creator><creator>Mertin, Stefan</creator><creator>Pensala, Tuomas</creator><creator>Ayazi, Farrokh</creator><creator>Ansari, Azadeh</creator><general>IEEE</general><general>The Institute of Electrical and Electronics Engineers, Inc. (IEEE)</general><scope>97E</scope><scope>RIA</scope><scope>RIE</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>7TB</scope><scope>7U5</scope><scope>8FD</scope><scope>FR3</scope><scope>L7M</scope><orcidid>https://orcid.org/0000-0002-4121-0982</orcidid><orcidid>https://orcid.org/0000-0002-4539-7393</orcidid><orcidid>https://orcid.org/0000-0001-9433-6370</orcidid><orcidid>https://orcid.org/0000-0002-2839-553X</orcidid></search><sort><creationdate>20201001</creationdate><title>A Film Bulk Acoustic Resonator Based on Ferroelectric Aluminum Scandium Nitride Films</title><author>Wang, Jialin ; Park, Mingyo ; Mertin, Stefan ; Pensala, Tuomas ; Ayazi, Farrokh ; Ansari, Azadeh</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c339t-4b397bb253a1da8ee56dee48e106feeb4709ad28e82e1b871d90e1959bc4c76a3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2020</creationdate><topic>Acoustic resonance</topic><topic>acoustic resonators</topic><topic>Acoustic waves</topic><topic>Acoustics</topic><topic>Aluminum nitride</topic><topic>aluminum scandium nitride</topic><topic>Broadband</topic><topic>Bulk acoustic wave devices</topic><topic>Coercivity</topic><topic>Coupling coefficients</topic><topic>Electric fields</topic><topic>Electric filters</topic><topic>Etching</topic><topic>fbar</topic><topic>Ferroelectric</topic><topic>Ferroelectric materials</topic><topic>Ferroelectricity</topic><topic>Film bulk acoustic resonators</topic><topic>filters</topic><topic>Frequency ranges</topic><topic>Frequency response</topic><topic>frequency tuning</topic><topic>piezoelectric films</topic><topic>Piezoelectricity</topic><topic>Polarization</topic><topic>Resonance</topic><topic>Resonant frequency</topic><topic>Resonators</topic><topic>Scandium</topic><topic>Superhigh frequencies</topic><topic>Switches</topic><topic>Switching</topic><topic>Thickness</topic><topic>Thin films</topic><topic>Tuning</topic><topic>Voltage measurement</topic><topic>Waveforms</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Wang, Jialin</creatorcontrib><creatorcontrib>Park, Mingyo</creatorcontrib><creatorcontrib>Mertin, Stefan</creatorcontrib><creatorcontrib>Pensala, Tuomas</creatorcontrib><creatorcontrib>Ayazi, Farrokh</creatorcontrib><creatorcontrib>Ansari, Azadeh</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 2005-present</collection><collection>IEEE All-Society Periodicals Package (ASPP) 1998-Present</collection><collection>IEEE Electronic Library (IEL)</collection><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Mechanical & Transportation Engineering Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>Technology Research Database</collection><collection>Engineering Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Journal of microelectromechanical systems</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Wang, Jialin</au><au>Park, Mingyo</au><au>Mertin, Stefan</au><au>Pensala, Tuomas</au><au>Ayazi, Farrokh</au><au>Ansari, Azadeh</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>A Film Bulk Acoustic Resonator Based on Ferroelectric Aluminum Scandium Nitride Films</atitle><jtitle>Journal of microelectromechanical systems</jtitle><stitle>JMEMS</stitle><date>2020-10-01</date><risdate>2020</risdate><volume>29</volume><issue>5</issue><spage>741</spage><epage>747</epage><pages>741-747</pages><issn>1057-7157</issn><eissn>1941-0158</eissn><coden>JMIYET</coden><abstract><![CDATA[This work reports on the first demonstration of the frequency tuning and intrinsic polarization switching of film bulk acoustic resonators (FBARs), based on sputtered AlScN piezoelectric thin films with Sc/(Al + Sc) ratio of approx. 30%. A box-like ferroelectric hysteresis behavior of 900 nm-thick Al 0.7 Sc 0.3 N sputtered films is obtained, showing a coercive electric field at ~3 MV/cm. The fundamental thickness-mode resonance of the bulk acoustic wave (BAW) resonator is measured at 3.17 GHz frequency with an excellent electromechanical coupling coefficient (<inline-formula> <tex-math notation="LaTeX">k_{t}^{2} </tex-math></inline-formula>) of 18.1%. The FBAR frequency response is studied, in both (i) the linear tuning regime, upon application of DC electric fields below the coercive field; as well as (ii) the polarization switching regime, upon application of electric fields above the coercive field. A large linear tuning range of 215 ppm <inline-formula> <tex-math notation="LaTeX">\times \,\,\mu \text{m} </tex-math></inline-formula>/V is obtained in case (i), resulting from the high scandium content. The series resonance frequency of the FBARs is switched ON and OFF in (ii) upon application of 350 V unipolar waveform across the Al 0.7 Sc 0.3 N thickness. This is the first demonstration of the intrinsically switchable AlN-based FBARs with a large tuning range; and record high <inline-formula> <tex-math notation="LaTeX">k_{t}^{2} </tex-math></inline-formula> reported for AlN-based FBARs to date. Furthermore, this work paves the way for realization of tunable and switchable wideband acoustic filters operating at super high frequency ranges (SHF). [2020-0203]]]></abstract><cop>New York</cop><pub>IEEE</pub><doi>10.1109/JMEMS.2020.3014584</doi><tpages>7</tpages><orcidid>https://orcid.org/0000-0002-4121-0982</orcidid><orcidid>https://orcid.org/0000-0002-4539-7393</orcidid><orcidid>https://orcid.org/0000-0001-9433-6370</orcidid><orcidid>https://orcid.org/0000-0002-2839-553X</orcidid><oa>free_for_read</oa></addata></record> |
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subjects | Acoustic resonance acoustic resonators Acoustic waves Acoustics Aluminum nitride aluminum scandium nitride Broadband Bulk acoustic wave devices Coercivity Coupling coefficients Electric fields Electric filters Etching fbar Ferroelectric Ferroelectric materials Ferroelectricity Film bulk acoustic resonators filters Frequency ranges Frequency response frequency tuning piezoelectric films Piezoelectricity Polarization Resonance Resonant frequency Resonators Scandium Superhigh frequencies Switches Switching Thickness Thin films Tuning Voltage measurement Waveforms |
title | A Film Bulk Acoustic Resonator Based on Ferroelectric Aluminum Scandium Nitride Films |
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