Cryo-based structural characterization and growth model of salt film on metal

•Salt film formed on SS304 was characterized using flash freezing and cryo-FIB/SEM.•Salt film exhibits porous structure with many pores, gaps and cavities.•Co-precipitated salt containing Fe and Ni cations was observed in the film.•Growth mechanism of the salt film was proposed based on ion transpor...

Full description

Saved in:
Bibliographic Details
Published in:Corrosion science 2020-09, Vol.174, p.108812, Article 108812
Main Authors: Li, Tianshu, Perea, D.E., Schreiber, D.K., Wirth, Mark G., Orren, Graham J., Frankel, G.S.
Format: Article
Language:English
Subjects:
Cryo-FIB/SEM
Cryogenic
Dissolution
Film growth
Freezing
Growth models
Ion beams
Ion transport
Nickel
Pitting corrosion
Salt film
Salt film modeling
Structural analysis
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:•Salt film formed on SS304 was characterized using flash freezing and cryo-FIB/SEM.•Salt film exhibits porous structure with many pores, gaps and cavities.•Co-precipitated salt containing Fe and Ni cations was observed in the film.•Growth mechanism of the salt film was proposed based on ion transport.•Self-regulating of the film brings the pitting system back to steady state. Metal salt films play a critical role in high rate dissolution processes such as within an active pit. However, structural and compositional characterization of salt films is challenging owing to the dynamic nature of the dissolving interface. Here, the salt film formed on SS304 one-dimensional artificial pit surface was preserved by flash freezing and characterized using cryo-based focused ion beam/scanning electron microscopy. The salt film exhibits a porous structure. Ni is co-located with Fe in the salt film, indicating the formation of co-precipitated salt containing Fe2+ and Ni2+. Additionally, a salt film growth model is presented based on ion transport.
ISSN:0010-938X
1879-0496
DOI:10.1016/j.corsci.2020.108812