Mass Spectrometric Study of Products of Teflon Degradation via Surface-Activated Laser Desorption/Ionization

Powders of metals (magnesium and tungsten) and nonmetals (boron and silicon) are used to analyze Fluralit-4 Teflon (polytetrafluoroethylene) powder by means of surface-activated laser desorption/ionization. It is shown that this technique allows the degree of Teflon degradation to be determined. It...

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Bibliographic Details
Published in:Russian Journal of Physical Chemistry A 2020-10, Vol.94 (10), p.2135-2140
Main Authors: Sholokhova, A. Yu, Malkin, A. I., Buryak, A. K.
Format: Article
Language:English
Subjects:
Boron
Chemistry
Chemistry and Materials Science
Degradation
Desorption
Ionization
Ions
Low molecular weights
Magnesium
Mass spectra
Nonmetals
Physical Chemistry
Physical Chemistry of Surface Phenomena
Polytetrafluoroethylene
Silicon
Spectrometry
Tungsten
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Summary:Powders of metals (magnesium and tungsten) and nonmetals (boron and silicon) are used to analyze Fluralit-4 Teflon (polytetrafluoroethylene) powder by means of surface-activated laser desorption/ionization. It is shown that this technique allows the degree of Teflon degradation to be determined. It is established that when silicon powder is used as a matrix, it is possible to register both low molecular weight products of the degradation of Teflon and its oligomeric products in the range of up to 1400 Da. The Teflon mass spectra contain two series of ions: one for saturated components and one for unsaturated components.
ISSN:0036-0244
1531-863X
DOI:10.1134/S003602442010026X