Influence of finite size and image charge screening on the antiferromagnetic ordering of CoO ultrathin films

•Coherent exchange scattering of low energy electrons from the CoO(001) surface.•Half-order spots in LEED reflect the antiferromagnetic ordering of the CoO film.•Evolution of surface Néel temperature with CoO film coverage.•Significant enhancement of surface Néel temperature beyond its bulk value.•D...

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Bibliographic Details
Published in:Journal of magnetism and magnetic materials 2020-12, Vol.515, p.167292, Article 167292
Main Authors: Barman, Sukanta, Kundu, Asish K., Menon, Krishnakumar S.R.
Format: Article
Language:English
Subjects:
Antiferromagnetism
Coherent scattering
Critical exponent
Critical temperature
Crossovers
Electron beams
Electronic structure
Energy gap
Exchange scattering
Half-order
Image charge
Low energy electron diffraction
Oxide thin films
Periodic variations
Photoelectric emission
Substrates
Surface antiferromagnetism
Thin films
Unit cell
Valence band
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Summary:•Coherent exchange scattering of low energy electrons from the CoO(001) surface.•Half-order spots in LEED reflect the antiferromagnetic ordering of the CoO film.•Evolution of surface Néel temperature with CoO film coverage.•Significant enhancement of surface Néel temperature beyond its bulk value.•Dimensional crossovers in the magnetic critical behaviour of CoO film. The surface antiferromagnetic (AFM) ordering of ultrathin CoO(001) films grown on Ag(001) has been investigated using low energy electron diffraction (LEED) and valence band photoemission spectroscopy. We have observed coherent exchange scattered half-order spots in LEED with a periodicity of the magnetic unit cell of the CoO(001) surface. These spots show very low intensities (2–3% of the integer-order spots) and are visible only below a critical temperature for low electron beam energies (
ISSN:0304-8853
1873-4766
DOI:10.1016/j.jmmm.2020.167292