Loading…

The FAIR Phase 0 program of the CBM TOF

In order to provide particle identification (PID) of charged hadrons at the future high-rate Compressed Baryonic Matter (CBM) experiment, the TOF group has developed a large-area Time-of-Flight (ToF) wall equipped with Multi-gap Resistive Plate Chambers (MRPC) capable to operate at incident particle...

Full description

Saved in:
Bibliographic Details
Published in:Journal of instrumentation 2020-10, Vol.15 (10), p.C10030-C10030
Main Authors: Deppner, I., Herrmann, N.
Format: Article
Language:English
Subjects:
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:In order to provide particle identification (PID) of charged hadrons at the future high-rate Compressed Baryonic Matter (CBM) experiment, the TOF group has developed a large-area Time-of-Flight (ToF) wall equipped with Multi-gap Resistive Plate Chambers (MRPC) capable to operate at incident particle fluxes of up to 30 kHz/cm2. Prior to its destined operation at the Facility for Antiproton and Ion Research (FAIR)—starting in 2025—this high-rate timing MRPC technology will be used for physics research at two scientific pillars of the FAIR Phase-0 program: the end-cap TOF upgrade of the STAR experiment at RHIC and the mini-TOF (mTOF) wall of the mini-CBM (mCBM) experiment at Schwerionensynchrotron18 (SIS18). At STAR, the fixed-target program of the Beam Energy Scan II (BES-II) will rely on 108 CBM MRPC detectors for forward PID at trigger rates of up to 2 kHz. At mCBM, high-performance benchmark runs of Lambda-baryon production at top SIS18 energies and CBM design interaction rates of 10 MHz will become feasible with a PID backbone consisting of 25 CBM MRPC detectors. Apart from the physics perspective, these pre-FAIR involvements will help gathering experience in operating the final CBM TOF wall comprising about 1500 MRPC detectors and 110,000 readout channels. The status of the FAIR phase 0 program will be discussed.
ISSN:1748-0221
1748-0221
DOI:10.1088/1748-0221/15/10/C10030