Single crystal growth and structural characterization of Cr doped Sb1.95Cr0.05Te3 single crystal

We report the high quality single crystal growth and X-ray diffraction characterization studies of bulk Sb1.95Cr0.05Te3 single crystals. Elemental analysis is confirmed by TEM EDX spectroscopy. Single crystal of Sb1.95Cr0.05Te3 is grown by modified Bridgman method. The diffraction peaks correspondin...

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Bibliographic Details
Main Authors: Dalui, T. K., Ghose, P. K., Giri, S.
Format: Conference Proceeding
Language:English
Subjects:
Bridgman method
Chromium
Crystal growth
Crystal structure
Single crystals
Structural analysis
X-ray diffraction
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Summary:We report the high quality single crystal growth and X-ray diffraction characterization studies of bulk Sb1.95Cr0.05Te3 single crystals. Elemental analysis is confirmed by TEM EDX spectroscopy. Single crystal of Sb1.95Cr0.05Te3 is grown by modified Bridgman method. The diffraction peaks corresponding to {0, 0, 3} planes reveal the growth of crystal along the c-direction. X-ray diffraction analysis using Rietveld refinement verifies the phase purity and confirms that the material crystalizes in a trigonal structure with R- 3m space group.
ISSN:0094-243X
1551-7616
DOI:10.1063/5.0016663