Integrated optical addressing of a trapped ytterbium ion

We report on the characterization of heating rates and photo-induced electric charging on a microfabricated surface ion trap with integrated waveguides. Microfabricated surface ion traps have received considerable attention as a quantum information platform due to their scalability and manufacturabi...

Full description

Saved in:
Bibliographic Details
Published in:arXiv.org 2021-04
Main Authors: Ivory, M, Setzer, W J, Karl, N, McGuinness, H, DeRose, C, Blain, M, Stick, D, Gehl, M, Parazzoli, L P
Format: Article
Language:English
Subjects:
Charging
Electric fields
Frequency stability
Heating rate
Ion traps (instrumentation)
Manufacturability
Quantum phenomena
Room temperature
Waveguides
Ytterbium
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:We report on the characterization of heating rates and photo-induced electric charging on a microfabricated surface ion trap with integrated waveguides. Microfabricated surface ion traps have received considerable attention as a quantum information platform due to their scalability and manufacturability. Here we characterize the delivery of 435 nm light through waveguides and diffractive couplers to a single ytterbium ion in a compact trap. We measure an axial heating rate at room temperature of \(0.78\pm0.05\) q/ms and see no increase due to the presence of the waveguide. Furthermore, the electric field due to charging of the exposed dielectric outcoupler settles under normal operation after an initial shift. The frequency instability after settling is measured to be 0.9 kHz.
ISSN:2331-8422
DOI:10.48550/arxiv.2011.12376