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New EPMA-XRF Integration Allows Rapid Trace Element Analysis of Geological Materials

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Bibliographic Details
Published in:Microscopy and microanalysis 2020-08, Vol.26 (S2), p.1882-1883
Main Authors: Wakimoto, Rie, Yokoyama, Takaomi, Tsukamoto, Kazunori, Kato, Koki, Robertson, Vernon
Format: Article
Language:English
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Online Access:Get full text
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ISSN:1431-9276
1435-8115
DOI:10.1017/S1431927620019698