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Focused-probe STEM Ptychography: Developments and Opportunities

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Bibliographic Details
Published in:Microscopy and microanalysis 2020-08, Vol.26 (S2), p.470-471
Main Authors: O'Leary, Colum, Liberti, Emanuela, Martinez, Gerardo, Allen, Christopher, Huang, Chen, Rothmann, Mathias, Luo, Hui, Kim, Judy, Herz, Laura, Assender, Hazel, Jones, Lewys, Kirkland, Angus, Nellist, Peter
Format: Article
Language:English
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ISSN:1431-9276
1435-8115
DOI:10.1017/S1431927620014762