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Magnetic Sector SIMS System with Continuous Focal Plane Detector for Advanced Analytical Capabilities on FIB Instruments

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Bibliographic Details
Published in:	Microscopy and microanalysis 2020-08, Vol.26 (S2), p.1972-1974
Main Authors:	Wirtz, Tom, De Castro, Olivier, Biesemeier, Antje, Hoang, Hung Quang, Audinot, Jean-Nicolas
Format:	Article
Language:	English
Subjects:	Focal plane High-Resolving Power, Multi-Modal and Correlative SIMS Imaging in Biology, Geology and Materials Magnetic sectors
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Online Access:	Get full text
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