Atomic Scale Tracking of a Charge Order Transition with Continuously Variable Temperature Cryo-STEM

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Bibliographic Details
Published in:Microscopy and microanalysis 2020-08, Vol.26 (S2), p.2034-2035
Main Authors: Schnitzer, Noah, Bianco, Elisabeth, Admasu, Alemayehu, Kim, Jaewook, Cheong, Sang-Wook, El Baggari, Ismail, Kourkoutis, Lena
Format: Article
Language:English
Subjects:
Continuously variable
In situ TEM at the Extremes - Extreme Temperature and Biasing
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ISSN:1431-9276
1435-8115
DOI:10.1017/S1431927620020218