Flow Patterns: Numerical Simulations and In Situ Optical Microscopy Connecting Flow Pattern, Crystallization, and Thin‐Film Properties for Organic Transistors with Superior Device‐to‐Device Uniformity (Adv. Mater. 48/2020)

A comprehensive analytical system that connects flow pattern, crystallization, and thin‐film properties is introduced by Steve Park, Jaewook Nam, and co‐workers in article number 2004864. Using 3D‐patterned microfluidic channels, flow pattern is precisely manipulated. 3D numerical simulation and in...

Full description

Saved in:
Bibliographic Details
Published in:Advanced materials (Weinheim) 2020-12, Vol.32 (48), p.n/a
Main Authors: Lee, Jeong‐Chan, Lee, Minho, Lee, Ho‐Jun, Ahn, Kwangguk, Nam, Jaewook, Park, Steve
Format: Article
Language:English
Subjects:
Crystallization
device uniformity
Flow distribution
flow patterns
Microfluidics
Microscopy
Optical microscopy
Optical properties
organic transistors
Semiconductor devices
thin films
Three dimensional flow
Transistors
Citations: Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:A comprehensive analytical system that connects flow pattern, crystallization, and thin‐film properties is introduced by Steve Park, Jaewook Nam, and co‐workers in article number 2004864. Using 3D‐patterned microfluidic channels, flow pattern is precisely manipulated. 3D numerical simulation and in situ microscopy enable tracking of the flow pattern along its entire path, elucidating its relation to the crystallization process. The resulting organic thin‐film transistors have superior device‐to‐device uniformity.
ISSN:0935-9648
1521-4095
DOI:10.1002/adma.202070357