Test Methodologies and Test-Time Compression for Emerging Non-Volatile Memory

Emerging nonvolatile memories (NVMs) are considered as suitable candidates to replace conventional memories such as static RAM (SRAM) and dynamic RAM (DRAM) due to high density, high performance, and low (static) power operation. However, NVMs bring new fault issues and call for new tests. For examp...

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Bibliographic Details
Published in:IEEE transactions on reliability 2020-12, Vol.69 (4), p.1387-1397
Main Authors: Khan, Mohammad Nasim Imtiaz, Ghosh, Swaroop
Format: Article
Language:English
Subjects:
Compression tests
Current distribution
Design for testability
Endurance/reliability test
magnetic tolerance test
Nonvolatile memory
NVM tests
Random access memory
read/write latency test
Resistance
retention test
supply noise test
test time analysis
thermal tolerance test
Time compression
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Description
Summary:Emerging nonvolatile memories (NVMs) are considered as suitable candidates to replace conventional memories such as static RAM (SRAM) and dynamic RAM (DRAM) due to high density, high performance, and low (static) power operation. However, NVMs bring new fault issues and call for new tests. For example, NVMs exhibit wide read and write latency distribution, incur high write current (leads to high supply noise), are susceptible to external magnetic/thermal field, show high and stochastic retention time, and are prone to endurance and reliability failures. The conventional tests either cannot capture the faults specific to emerging NVMs or they incur significant test time if implemented on emerging NVMs. In this article, we summarize fault models specific to NVMs and explain the related test issues and challenges. We also propose new tests along with necessary design-for-test techniques to characterize the failures. We further summarize NVM tests proposed in prior works and analyze their test time requirements.
ISSN:0018-9529
1558-1721
DOI:10.1109/TR.2019.2919466