High-Bandwidth Low-Inductance Current Shunt for Wide-Bandgap Devices Dynamic Characterization

High bandwidth sensors are required to measure the wide-bandgap devices' transient behavior because of their fast switching speed. In addition to high bandwidth, the current sensor must introduce little extra parasitic inductance to the switching power loop. The analysis of conventional shunt r...

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Bibliographic Details
Published in:IEEE transactions on power electronics 2021-04, Vol.36 (4), p.4522-4531
Main Authors: Zhang, Wen, Zhang, Zheyu, Wang, Fred, Brush, Edward V., Forcier, Neil
Format: Article
Language:English
Subjects:
Aluminum oxide
Bandwidth
Bandwidths
Current measurement
Current sensor
double pulse test (DPT)
Energy gap
Energy rating
Gallium nitrides
Heterojunctions
Inductance
measurement bandwidth
network analyzer
parasitic inductance
Parasitics (electronics)
Resistors
Sensors
Substrates
Switches
Switching
Thin films
Transient analysis
Transient current
Transistors
Waveforms
wide-bandgap devices
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Summary:High bandwidth sensors are required to measure the wide-bandgap devices' transient behavior because of their fast switching speed. In addition to high bandwidth, the current sensor must introduce little extra parasitic inductance to the switching power loop. The analysis of conventional shunt resistors shows the key to high bandwidth is the coaxial structure and its parasitic inductance is proportional to its transient heat energy rating. By combining the structure of coaxial shunt resistor and alumina substrate surface mount thin film resistors, a novel surface mount coaxial shunt resistor is introduced. Experimental measurement verifies its capability of achieving very high bandwidth while introducing very low parasitic inductance. The design can achieve up to 2.23-GHz measurement bandwidth while keeping its parasitic inductance as low as 0.12 nH. Application in gallium nitride heterojunction-field-effect-transistors double pulse test shows it can faithfully capture the transient current waveform while introducing little interference to the switching behavior.
ISSN:0885-8993
1941-0107
DOI:10.1109/TPEL.2020.3026262