Loading…
Opto- electrical properties of p-SnSe:S/N-Si heterojunction for solar cell application
Pure SnSe thin film and doped with S at different percentage (0,3,5,7)% were deposited from alloy by thermal evaporation technique on glass substrate at room temperature with 400±20nm thickness .The influences of S dopant ratio on characterization of SnSe thin film Nano crystalline was investigated...
Saved in:
Main Authors: | , , , |
---|---|
Format: | Conference Proceeding |
Language: | English |
Subjects: | |
Online Access: | Get full text |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
cited_by | |
---|---|
cites | |
container_end_page | |
container_issue | 1 |
container_start_page | |
container_title | |
container_volume | 2307 |
creator | Ahmed, Ghuzlan Sarhan Al-Maiyaly, Bushra K. H. Hussein, Bushra H. Hassun, Hanan K. |
description | Pure SnSe thin film and doped with S at different percentage (0,3,5,7)% were deposited from alloy by thermal evaporation technique on glass substrate at room temperature with 400±20nm thickness .The influences of S dopant ratio on characterization of SnSe thin film Nano crystalline was investigated by using Atomic force microscopy(AFM), X-ray diffraction (XRD), energy dispersive spectroscopy (EDS), Hall Effect measurement, UV-Vis absorption spectroscopy to study morphological, structural, electrical and optical properties respectively .The XRD showed that all the films have polycrystalline in nature with orthorhombic structure, with preferred orientation along (111)plane .These films was manufactured of very fine crystalline size in the range of (18.167-51.126)nm, depending on the S ratio doping, the results of AFM indicated that these films were Nano crystalline with grain size (60.12-84.25)nm .Direct band gap values with range(1.5-1.68)eV were gotten from optical absorption measurements. I-V characteristics for p- SnSe:S/n-Si heterojunctions show the efficiency of solar cell increase with increase doping ratio and the highest value at films doped with ratio (7%S). C-V measurements show that all junctions were an abrupt type. |
doi_str_mv | 10.1063/5.0033131 |
format | conference_proceeding |
fullrecord | <record><control><sourceid>proquest_scita</sourceid><recordid>TN_cdi_proquest_journals_2470105664</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>2470105664</sourcerecordid><originalsourceid>FETCH-LOGICAL-p288t-dd8b9b20ee89b989a0f3537ab8fd98a445a69413c1b932ca848d6c68f61fe52e3</originalsourceid><addsrcrecordid>eNp9kE1LAzEYhIMoWKsH_0HAm5A22Xxs4k2KVaHYw6p4C9lsglvWTcymgv_erS148zSH93lnhgHgkuAZwYLO-QxjSgklR2BCOCeoFEQcgwnGiqGC0bdTcDYMG4wLVZZyAl7XMQcEXedsTq01HYwpRJdy6wYYPIyo6it3U82fUNXCd5ddCpttb3MbeuhDgkPoTILWdR00MXajxe50Dk686QZ3cdApeFnePS8e0Gp9_7i4XaFYSJlR08ha1QV2TqpaSWWwp5yWppa-UdIwxo1QjFBLakULaySTjbBCekG844WjU3C19x1bf27dkPUmbFM_RuqClZhgLgQbqes9Ndg2__bTMbUfJn3rr5A014fNdGz8fzDBejfy3wP9Afolbgs</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>conference_proceeding</recordtype><pqid>2470105664</pqid></control><display><type>conference_proceeding</type><title>Opto- electrical properties of p-SnSe:S/N-Si heterojunction for solar cell application</title><source>American Institute of Physics:Jisc Collections:Transitional Journals Agreement 2021-23 (Reading list)</source><creator>Ahmed, Ghuzlan Sarhan ; Al-Maiyaly, Bushra K. H. ; Hussein, Bushra H. ; Hassun, Hanan K.</creator><contributor>Salame, Chafic-Touma ; Jabur, Akram R ; Haider, Adawiya J ; Shaban, Auday</contributor><creatorcontrib>Ahmed, Ghuzlan Sarhan ; Al-Maiyaly, Bushra K. H. ; Hussein, Bushra H. ; Hassun, Hanan K. ; Salame, Chafic-Touma ; Jabur, Akram R ; Haider, Adawiya J ; Shaban, Auday</creatorcontrib><description>Pure SnSe thin film and doped with S at different percentage (0,3,5,7)% were deposited from alloy by thermal evaporation technique on glass substrate at room temperature with 400±20nm thickness .The influences of S dopant ratio on characterization of SnSe thin film Nano crystalline was investigated by using Atomic force microscopy(AFM), X-ray diffraction (XRD), energy dispersive spectroscopy (EDS), Hall Effect measurement, UV-Vis absorption spectroscopy to study morphological, structural, electrical and optical properties respectively .The XRD showed that all the films have polycrystalline in nature with orthorhombic structure, with preferred orientation along (111)plane .These films was manufactured of very fine crystalline size in the range of (18.167-51.126)nm, depending on the S ratio doping, the results of AFM indicated that these films were Nano crystalline with grain size (60.12-84.25)nm .Direct band gap values with range(1.5-1.68)eV were gotten from optical absorption measurements. I-V characteristics for p- SnSe:S/n-Si heterojunctions show the efficiency of solar cell increase with increase doping ratio and the highest value at films doped with ratio (7%S). C-V measurements show that all junctions were an abrupt type.</description><identifier>ISSN: 0094-243X</identifier><identifier>EISSN: 1551-7616</identifier><identifier>DOI: 10.1063/5.0033131</identifier><identifier>CODEN: APCPCS</identifier><language>eng</language><publisher>Melville: American Institute of Physics</publisher><subject>Atomic force microscopy ; Crystal structure ; Crystallinity ; Current voltage characteristics ; Doping ; Electrical junctions ; Electrical properties ; Glass substrates ; Grain size ; Hall effect ; Heterojunctions ; Optical properties ; Photovoltaic cells ; Preferred orientation ; Room temperature ; Solar cells ; Spectrum analysis ; Thin films ; X-ray diffraction</subject><ispartof>AIP conference proceedings, 2020, Vol.2307 (1)</ispartof><rights>Author(s)</rights><rights>2020 Author(s). Published by AIP Publishing.</rights><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>309,310,314,776,780,785,786,23909,23910,25118,27901,27902</link.rule.ids></links><search><contributor>Salame, Chafic-Touma</contributor><contributor>Jabur, Akram R</contributor><contributor>Haider, Adawiya J</contributor><contributor>Shaban, Auday</contributor><creatorcontrib>Ahmed, Ghuzlan Sarhan</creatorcontrib><creatorcontrib>Al-Maiyaly, Bushra K. H.</creatorcontrib><creatorcontrib>Hussein, Bushra H.</creatorcontrib><creatorcontrib>Hassun, Hanan K.</creatorcontrib><title>Opto- electrical properties of p-SnSe:S/N-Si heterojunction for solar cell application</title><title>AIP conference proceedings</title><description>Pure SnSe thin film and doped with S at different percentage (0,3,5,7)% were deposited from alloy by thermal evaporation technique on glass substrate at room temperature with 400±20nm thickness .The influences of S dopant ratio on characterization of SnSe thin film Nano crystalline was investigated by using Atomic force microscopy(AFM), X-ray diffraction (XRD), energy dispersive spectroscopy (EDS), Hall Effect measurement, UV-Vis absorption spectroscopy to study morphological, structural, electrical and optical properties respectively .The XRD showed that all the films have polycrystalline in nature with orthorhombic structure, with preferred orientation along (111)plane .These films was manufactured of very fine crystalline size in the range of (18.167-51.126)nm, depending on the S ratio doping, the results of AFM indicated that these films were Nano crystalline with grain size (60.12-84.25)nm .Direct band gap values with range(1.5-1.68)eV were gotten from optical absorption measurements. I-V characteristics for p- SnSe:S/n-Si heterojunctions show the efficiency of solar cell increase with increase doping ratio and the highest value at films doped with ratio (7%S). C-V measurements show that all junctions were an abrupt type.</description><subject>Atomic force microscopy</subject><subject>Crystal structure</subject><subject>Crystallinity</subject><subject>Current voltage characteristics</subject><subject>Doping</subject><subject>Electrical junctions</subject><subject>Electrical properties</subject><subject>Glass substrates</subject><subject>Grain size</subject><subject>Hall effect</subject><subject>Heterojunctions</subject><subject>Optical properties</subject><subject>Photovoltaic cells</subject><subject>Preferred orientation</subject><subject>Room temperature</subject><subject>Solar cells</subject><subject>Spectrum analysis</subject><subject>Thin films</subject><subject>X-ray diffraction</subject><issn>0094-243X</issn><issn>1551-7616</issn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2020</creationdate><recordtype>conference_proceeding</recordtype><recordid>eNp9kE1LAzEYhIMoWKsH_0HAm5A22Xxs4k2KVaHYw6p4C9lsglvWTcymgv_erS148zSH93lnhgHgkuAZwYLO-QxjSgklR2BCOCeoFEQcgwnGiqGC0bdTcDYMG4wLVZZyAl7XMQcEXedsTq01HYwpRJdy6wYYPIyo6it3U82fUNXCd5ddCpttb3MbeuhDgkPoTILWdR00MXajxe50Dk686QZ3cdApeFnePS8e0Gp9_7i4XaFYSJlR08ha1QV2TqpaSWWwp5yWppa-UdIwxo1QjFBLakULaySTjbBCekG844WjU3C19x1bf27dkPUmbFM_RuqClZhgLgQbqes9Ndg2__bTMbUfJn3rr5A014fNdGz8fzDBejfy3wP9Afolbgs</recordid><startdate>20201215</startdate><enddate>20201215</enddate><creator>Ahmed, Ghuzlan Sarhan</creator><creator>Al-Maiyaly, Bushra K. H.</creator><creator>Hussein, Bushra H.</creator><creator>Hassun, Hanan K.</creator><general>American Institute of Physics</general><scope>8FD</scope><scope>H8D</scope><scope>L7M</scope></search><sort><creationdate>20201215</creationdate><title>Opto- electrical properties of p-SnSe:S/N-Si heterojunction for solar cell application</title><author>Ahmed, Ghuzlan Sarhan ; Al-Maiyaly, Bushra K. H. ; Hussein, Bushra H. ; Hassun, Hanan K.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-p288t-dd8b9b20ee89b989a0f3537ab8fd98a445a69413c1b932ca848d6c68f61fe52e3</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2020</creationdate><topic>Atomic force microscopy</topic><topic>Crystal structure</topic><topic>Crystallinity</topic><topic>Current voltage characteristics</topic><topic>Doping</topic><topic>Electrical junctions</topic><topic>Electrical properties</topic><topic>Glass substrates</topic><topic>Grain size</topic><topic>Hall effect</topic><topic>Heterojunctions</topic><topic>Optical properties</topic><topic>Photovoltaic cells</topic><topic>Preferred orientation</topic><topic>Room temperature</topic><topic>Solar cells</topic><topic>Spectrum analysis</topic><topic>Thin films</topic><topic>X-ray diffraction</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Ahmed, Ghuzlan Sarhan</creatorcontrib><creatorcontrib>Al-Maiyaly, Bushra K. H.</creatorcontrib><creatorcontrib>Hussein, Bushra H.</creatorcontrib><creatorcontrib>Hassun, Hanan K.</creatorcontrib><collection>Technology Research Database</collection><collection>Aerospace Database</collection><collection>Advanced Technologies Database with Aerospace</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Ahmed, Ghuzlan Sarhan</au><au>Al-Maiyaly, Bushra K. H.</au><au>Hussein, Bushra H.</au><au>Hassun, Hanan K.</au><au>Salame, Chafic-Touma</au><au>Jabur, Akram R</au><au>Haider, Adawiya J</au><au>Shaban, Auday</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Opto- electrical properties of p-SnSe:S/N-Si heterojunction for solar cell application</atitle><btitle>AIP conference proceedings</btitle><date>2020-12-15</date><risdate>2020</risdate><volume>2307</volume><issue>1</issue><issn>0094-243X</issn><eissn>1551-7616</eissn><coden>APCPCS</coden><abstract>Pure SnSe thin film and doped with S at different percentage (0,3,5,7)% were deposited from alloy by thermal evaporation technique on glass substrate at room temperature with 400±20nm thickness .The influences of S dopant ratio on characterization of SnSe thin film Nano crystalline was investigated by using Atomic force microscopy(AFM), X-ray diffraction (XRD), energy dispersive spectroscopy (EDS), Hall Effect measurement, UV-Vis absorption spectroscopy to study morphological, structural, electrical and optical properties respectively .The XRD showed that all the films have polycrystalline in nature with orthorhombic structure, with preferred orientation along (111)plane .These films was manufactured of very fine crystalline size in the range of (18.167-51.126)nm, depending on the S ratio doping, the results of AFM indicated that these films were Nano crystalline with grain size (60.12-84.25)nm .Direct band gap values with range(1.5-1.68)eV were gotten from optical absorption measurements. I-V characteristics for p- SnSe:S/n-Si heterojunctions show the efficiency of solar cell increase with increase doping ratio and the highest value at films doped with ratio (7%S). C-V measurements show that all junctions were an abrupt type.</abstract><cop>Melville</cop><pub>American Institute of Physics</pub><doi>10.1063/5.0033131</doi><tpages>9</tpages><oa>free_for_read</oa></addata></record> |
fulltext | fulltext |
identifier | ISSN: 0094-243X |
ispartof | AIP conference proceedings, 2020, Vol.2307 (1) |
issn | 0094-243X 1551-7616 |
language | eng |
recordid | cdi_proquest_journals_2470105664 |
source | American Institute of Physics:Jisc Collections:Transitional Journals Agreement 2021-23 (Reading list) |
subjects | Atomic force microscopy Crystal structure Crystallinity Current voltage characteristics Doping Electrical junctions Electrical properties Glass substrates Grain size Hall effect Heterojunctions Optical properties Photovoltaic cells Preferred orientation Room temperature Solar cells Spectrum analysis Thin films X-ray diffraction |
title | Opto- electrical properties of p-SnSe:S/N-Si heterojunction for solar cell application |
url | http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-04T12%3A27%3A06IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_scita&rft_val_fmt=info:ofi/fmt:kev:mtx:book&rft.genre=proceeding&rft.atitle=Opto-%20electrical%20properties%20of%20p-SnSe:S/N-Si%20heterojunction%20for%20solar%20cell%20application&rft.btitle=AIP%20conference%20proceedings&rft.au=Ahmed,%20Ghuzlan%20Sarhan&rft.date=2020-12-15&rft.volume=2307&rft.issue=1&rft.issn=0094-243X&rft.eissn=1551-7616&rft.coden=APCPCS&rft_id=info:doi/10.1063/5.0033131&rft_dat=%3Cproquest_scita%3E2470105664%3C/proquest_scita%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-p288t-dd8b9b20ee89b989a0f3537ab8fd98a445a69413c1b932ca848d6c68f61fe52e3%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_pqid=2470105664&rft_id=info:pmid/&rfr_iscdi=true |