Fabrication-Tolerant CWDM (de)Multiplexer Based on Cascaded Mach-Zehnder Interferometers on Silicon-on-Insulator

We demonstrate a cascaded Mach-Zehnder interferometer (MZI) based coarse wavelength division multiplexing (CWDM) (de)multiplexer on silicon-on-insulator with its spectral responses well aligned to the defined wavelength grids and are highly tolerant to the manufacturing linewidth variability. This w...

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Bibliographic Details
Published in:Journal of lightwave technology 2021-01, Vol.39 (1), p.146-153
Main Authors: Yen, Tzu-Hsiang, Hung, Yung-Jr
Format: Article
Language:English
Subjects:
Chip formation
Circuit design
Crosstalk
Indexes
Insertion loss
Integrated circuits
Mach-Zehnder interferometers
Mach–Zehnder interferometer
manufacturing variability
Multiplexers
Optical device fabrication
Optical filters
Optical waveguides
Photonics
Silicon
silicon photonics
SOI (semiconductors)
Spectra
Wave division multiplexing
Waveguide transitions
Waveguides
Wavelength division multiplexing
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Description
Summary:We demonstrate a cascaded Mach-Zehnder interferometer (MZI) based coarse wavelength division multiplexing (CWDM) (de)multiplexer on silicon-on-insulator with its spectral responses well aligned to the defined wavelength grids and are highly tolerant to the manufacturing linewidth variability. This was achieved by optimizing the waveguide widths and lengths of two arms in every MZI. As-realized CWDM (de)multiplexer exhibits a spectral shift of 0.487 nm, an insertion loss of less than 2.1 dB, and a channel crosstalk of lower than −20 dB, while reference devices fabricated on the same chips suffer from serious spectral shift of 15.4 nm to the shorter wavelength and higher insertion loss/channel crosstalk. The proposed MZI design concept can be applied to all MZI-based photonic devices and related photonic integrated circuits, so this work validates a promising design path towards practical WDM applications on silicon-on-insulator.
ISSN:0733-8724
1558-2213
DOI:10.1109/JLT.2020.3026314