Reconfigurable Flat Optics with Programmable Reflection Amplitude Using Lithography‐Free Phase‐Change Material Ultra‐Thin Films (Advanced Optical Materials 2/2021)

This cover page illustrates a near‐infrared light beam being reflected off a multilayer stack comprising a thin layer of GeSbTe (GST), a dielectric spacer, and a gold layer. By engineering the thicknesses, a very large dynamic optical modulation from strong reflection (R = 80%) to perfect absorption...

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Bibliographic Details
Published in:Advanced optical materials 2021-01, Vol.9 (2), p.n/a
Main Authors: Cueff, Sébastien, Taute, Arnaud, Bourgade, Antoine, Lumeau, Julien, Monfray, Stephane, Song, Qinghua, Genevet, Patrice, Devif, Brice, Letartre, Xavier, Berguiga, Lotfi
Format: Article
Language:English
Subjects:
Crystallization
Infrared radiation
Light beams
light modulation
Lithography
Materials science
Multilayers
Optical properties
Optics
perfect absorber
phase‐change materials
Reconfiguration
Reflection
Thickness
Thin films
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Summary:This cover page illustrates a near‐infrared light beam being reflected off a multilayer stack comprising a thin layer of GeSbTe (GST), a dielectric spacer, and a gold layer. By engineering the thicknesses, a very large dynamic optical modulation from strong reflection (R = 80%) to perfect absorption (A > 99.995%) is experimentally demonstrated via changing the phase of GST. This lithography‐free platform features multilevel and non‐volatile reconfigurable optical properties: more than 100 intermediate levels of reflection, corresponding to different partial crystallization of GST, were demonstrated. For further details see article number 2001291 by Lotfi Berguiga and co‐workers.
ISSN:2195-1071
2195-1071
DOI:10.1002/adom.202170006