Ameliorated Electrical-Tree Resistant Characteristics of UV-Initiated Cross-Linked Polyethylene Nanocomposites with Surface-Functionalized Nanosilica

• Published in: Processes 2021-02, Vol.9 (2), p.313
• Main Authors: Zhang, Yong-Qi, Yu, Ping-Lan, Sun, Wei-Feng, Wang, Xuan
• Format: Article
• Language: English
• Subjects: Chemical reactions; Chemistry; Coupling agents; Cross-linked polyethylene; Crosslinking; Dielectric breakdown; Dielectric strength; Electric fields; Electrical resistance; Electrical resistivity; Ethanol; Finite element method; Fourier transforms; Fractal geometry; Grafting; Infrared spectroscopy; Insulation; Interfaces; Light; Mathematical models; Mechanical properties; Morphology; Nanocomposites; Nanoparticles; NMR; Nuclear magnetic resonance; Polyethylene; Polymers; Scanning electron microscopy; Silanes; Silicon dioxide; Sulfur; Trees; Trimethylolpropane triacrylate
• ISSN: 2227-9717; 2227-9717
• DOI: 10.3390/pr9020313

Given the high interest in promoting crosslinking efficiency of ultraviolet-initiated crosslinking technique and ameliorating electrical resistance of crosslinked polyethylene (XLPE) materials, we have developed the funcionalized-SiO2/XLPE nanocomposites by chemically grafting auxiliary crosslinkers onto nanosilica surfaces. Trimethylolpropane triacrylate (TMPTA) as an effective auxiliary crosslinker for polyethylene is grafted successfully on nanosilica surfaces through thiolene-click chemical reactions with coupling agents of sulfur silanes and 3-mercaptopropyl trimethoxy silane (MPTMS), as characterized by nuclear magnetic resonance and Fourier transform infrared spectroscopy. The functionalized SiO2 nanoparticles could be dispersively filled into polyethylene matrix even at a high filling content that would generally produce agglomerations of neat SiO2 nanofillers. Ultraviolet-initiated polyethylene crosslinking reactions are efficiently stimulated by TMPTA grafted onto surfaces of SiO2 nanofillers, averting thermal migrations out of polyethylene matrix. Electrical-tree pathways and growth mechanism are specifically investigated by elucidating the microscopic tree-morphology with fractal dimension and simulating electric field distributions with finite-element method. Near nano-interfaces where the shielded-out electric fluxlines concentrate, the highly enhanced electric fields will stimulate partial discharging and thus lead to the electrical-trees being able to propagate along the routes between nanofillers. Surface-modified SiO2 nanofillers evidently elongate the circuitous routes of electrical-tree growth to be restricted from directly developing toward ground electrode, which accounts for the larger fractal dimension and shorter length of electrical-trees in the functionlized-SiO2/XLPE nanocomposite compared with XLPE and neat-SiO2/XLPE nanocomposite. Polar-groups on the modified nanosilica surfaces inhibit electrical-tree growth and simultaneously introduce deep traps impeding charge injections, accounting for the significant improvements of electrical-tree resistance and dielectric breakdown strength. Combining surface functionalization and nanodielectric technology, we propose a strategy to develop XLPE materials with high electrical resistance.