Effect of Carrier Heating by the GaAs Picosecond Stimulated Emission on Duration of Emission

The real-time measured envelopes of high-power picosecond optical pumping and of the intrinsic stimulated picosecond emission of a thin GaAs layer are compared. The emission duration excess over the pump duration is explained on the basis of negative feedback between the emission intensity and carri...

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Bibliographic Details
Published in:Semiconductors (Woodbury, N.Y.) N.Y.), 2021-02, Vol.55 (2), p.154-161
Main Authors: Ageeva, N. N., Bronevoi, I. L., Zabegaev, D. N., Krivonosov, A. N.
Format: Article
Language:English
Subjects:
Comparative analysis
Cooling effects
Emission
Gallium arsenide
Heating
Interaction with Radiation
Magnetic Materials
Magnetism
Negative feedback
Optical pumping
Physics
Physics and Astronomy
Spectroscopy
Stimulated emission
Time measurement
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Summary:The real-time measured envelopes of high-power picosecond optical pumping and of the intrinsic stimulated picosecond emission of a thin GaAs layer are compared. The emission duration excess over the pump duration is explained on the basis of negative feedback between the emission intensity and carrier heating by this emission. The main parameter of this duration excess is the characteristic carrier cooling time slowed down due to carrier heating by emission. The effect of this time on renormalization of the band gap due to the Coulomb interaction of carriers is also noted. The part of the concept of the picosecond dynamics of the intense stimulated emission of GaAs, which has been obtained to date in our works with co-authors, is given in Conclusions.
ISSN:1063-7826
1090-6479
DOI:10.1134/S1063782621020056