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Thermally-induced nonlinear optical properties of Ti-Al oxide nano-films with double epsilon-near-zero behavior
This research examines the thermally-induced nonlinear optical properties of Ti-Al-oxide nano-films. The Ti-Al nano-layer system was sequentially evaporated on glass and c-Si(100) substrates at room temperature. The Ti layers were spontaneously oxidized by the residual oxygen of the background vacuu...
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Published in: | Optical materials express 2021-02, Vol.11 (2), p.412 |
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creator | Abu-Safe, Husam H. Al-Esseili, Razan Arabasi, Sameer El-Nasser, Husam Zakaria, Yahya |
description | This research examines the thermally-induced nonlinear optical properties of Ti-Al-oxide nano-films. The Ti-Al nano-layer system was sequentially evaporated on glass and c-Si(100) substrates at room temperature. The Ti layers were spontaneously oxidized by the residual oxygen of the background vacuum in the deposition chamber. The Al layer, on the other hand, was partially oxidized and contained metallic inclusions. However, when oxygen was deliberately introduced into the chamber, the Al layer was oxidized with smaller inclusions. We experimentally demonstrate the existence of double epsilon-near-zero (2ENZ) behavior in the oxidized Al films by directly measuring the dielectric permittivity through ellipsometric analysis. The Maxwell-Garnett theory for a composite film formed by a mixture of Al and TiO2 inclusions in Ti-Al-oxide matrix was used to predict the two cross-over points of the ENZ behavior. Enhancement in the nonlinear optical response near the ENZ points was obtained. |
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The Ti-Al nano-layer system was sequentially evaporated on glass and c-Si(100) substrates at room temperature. The Ti layers were spontaneously oxidized by the residual oxygen of the background vacuum in the deposition chamber. The Al layer, on the other hand, was partially oxidized and contained metallic inclusions. However, when oxygen was deliberately introduced into the chamber, the Al layer was oxidized with smaller inclusions. We experimentally demonstrate the existence of double epsilon-near-zero (2ENZ) behavior in the oxidized Al films by directly measuring the dielectric permittivity through ellipsometric analysis. The Maxwell-Garnett theory for a composite film formed by a mixture of Al and TiO2 inclusions in Ti-Al-oxide matrix was used to predict the two cross-over points of the ENZ behavior. 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The Ti-Al nano-layer system was sequentially evaporated on glass and c-Si(100) substrates at room temperature. The Ti layers were spontaneously oxidized by the residual oxygen of the background vacuum in the deposition chamber. The Al layer, on the other hand, was partially oxidized and contained metallic inclusions. However, when oxygen was deliberately introduced into the chamber, the Al layer was oxidized with smaller inclusions. We experimentally demonstrate the existence of double epsilon-near-zero (2ENZ) behavior in the oxidized Al films by directly measuring the dielectric permittivity through ellipsometric analysis. The Maxwell-Garnett theory for a composite film formed by a mixture of Al and TiO2 inclusions in Ti-Al-oxide matrix was used to predict the two cross-over points of the ENZ behavior. Enhancement in the nonlinear optical response near the ENZ points was obtained.</description><subject>Aluminum</subject><subject>Chambers</subject><subject>Crossovers</subject><subject>Ellipsometry</subject><subject>Glass substrates</subject><subject>Inclusions</subject><subject>Nonlinear optics</subject><subject>Nonlinear response</subject><subject>Optical properties</subject><subject>Room temperature</subject><subject>Silicon substrates</subject><subject>Titanium</subject><subject>Titanium dioxide</subject><issn>2159-3930</issn><issn>2159-3930</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2021</creationdate><recordtype>article</recordtype><recordid>eNpNkE1LAzEQhoMoWGov_oKANyE1n7vZYynVCpVe6nnJZhOakiZrsqvWX--WenAuM4eHd2YeAO4JnhNW8Kft22rOCatKegUmlIgKsYrh63_zLZjlfMBjiYJKSicg7vYmHZX3J-RCO2jTwhCDd8GoBGPXO6087FLsTOqdyTBauHNo4WH8dq2BQYWIrPPHDL9cv4dtHBpvoOmy8zGgcwr6MSnCxuzVp4vpDtxY5bOZ_fUpeH9e7ZZrtNm-vC4XG6Sp4D0SVkvdEGa5VG3JGi5YIzAvK40FlZxy3GhZGEW4ZeMfikrSyFbg0o40qQSbgodL7nj7x2ByXx_ikMK4sqa8YrLABeUj9XihdIo5J2PrLrmjSqea4PrstB6d1hen7BfoiGlx</recordid><startdate>20210201</startdate><enddate>20210201</enddate><creator>Abu-Safe, Husam H.</creator><creator>Al-Esseili, Razan</creator><creator>Arabasi, Sameer</creator><creator>El-Nasser, Husam</creator><creator>Zakaria, Yahya</creator><general>Optical Society of America</general><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>7U5</scope><scope>8FD</scope><scope>H8D</scope><scope>L7M</scope><orcidid>https://orcid.org/0000-0003-0626-8019</orcidid></search><sort><creationdate>20210201</creationdate><title>Thermally-induced nonlinear optical properties of Ti-Al oxide nano-films with double epsilon-near-zero behavior</title><author>Abu-Safe, Husam H. ; Al-Esseili, Razan ; Arabasi, Sameer ; El-Nasser, Husam ; Zakaria, Yahya</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c254t-5fc8cb13f48ad73b453b50479c05284240bc86ea14f3822a281b8d507fd731953</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2021</creationdate><topic>Aluminum</topic><topic>Chambers</topic><topic>Crossovers</topic><topic>Ellipsometry</topic><topic>Glass substrates</topic><topic>Inclusions</topic><topic>Nonlinear optics</topic><topic>Nonlinear response</topic><topic>Optical properties</topic><topic>Room temperature</topic><topic>Silicon substrates</topic><topic>Titanium</topic><topic>Titanium dioxide</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Abu-Safe, Husam H.</creatorcontrib><creatorcontrib>Al-Esseili, Razan</creatorcontrib><creatorcontrib>Arabasi, Sameer</creatorcontrib><creatorcontrib>El-Nasser, Husam</creatorcontrib><creatorcontrib>Zakaria, Yahya</creatorcontrib><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>Technology Research Database</collection><collection>Aerospace Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Optical materials express</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Abu-Safe, Husam H.</au><au>Al-Esseili, Razan</au><au>Arabasi, Sameer</au><au>El-Nasser, Husam</au><au>Zakaria, Yahya</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Thermally-induced nonlinear optical properties of Ti-Al oxide nano-films with double epsilon-near-zero behavior</atitle><jtitle>Optical materials express</jtitle><date>2021-02-01</date><risdate>2021</risdate><volume>11</volume><issue>2</issue><spage>412</spage><pages>412-</pages><issn>2159-3930</issn><eissn>2159-3930</eissn><abstract>This research examines the thermally-induced nonlinear optical properties of Ti-Al-oxide nano-films. 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subjects | Aluminum Chambers Crossovers Ellipsometry Glass substrates Inclusions Nonlinear optics Nonlinear response Optical properties Room temperature Silicon substrates Titanium Titanium dioxide |
title | Thermally-induced nonlinear optical properties of Ti-Al oxide nano-films with double epsilon-near-zero behavior |
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