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Influence of data input in the evaluation of Stress Intensity Factors from Thermoelastic Stress Analysis
Thermoelastic Stress Analysis (TSA) is applied to evaluate the Stress Intensity Factor (SIF), T-stress and J-Integral in a Single-Edge-Notched-Tension sample undergoing fatigue cycling. The Williams’ series stress formulation and a least-square fitting (LSF) procedure are used to obtain the SIF and...
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Published in: | IOP conference series. Materials Science and Engineering 2021-02, Vol.1038 (1), p.12023 |
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Main Authors: | , , , |
Format: | Article |
Language: | English |
Subjects: | |
Citations: | Items that this one cites Items that cite this one |
Online Access: | Get full text |
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Summary: | Thermoelastic Stress Analysis (TSA) is applied to evaluate the Stress Intensity Factor (SIF), T-stress and J-Integral in a Single-Edge-Notched-Tension sample undergoing fatigue cycling. The Williams’ series stress formulation and a least-square fitting (LSF) procedure are used to obtain the SIF and the T-stress. The evaluation is carried out with the aim to investigate the influence of the input data in the system of equations solved with the LSF, and in particular: the number of coefficients used in the Williams’ series and the choice and position of the fitted experimental data points. Three algorithms for the determination of the crack tip position are also evaluated: a coarse grid method with pixel resolution, a refined grid method and a patternsearch method with sub-pixel resolution. In order to establish a criterion for the choice of input parameters for the LSF, the theoretical case of an infinite plate with a central crack has been analysed, for which an exact solution of the isopachics, SIF and T-stress is available. Finally, the stress separation obtained with the fully characterised Williams’ model is also used to evaluate the J-Integral by applying an Energy-Domain-Integral formulation, and the SIF retrieved from the J-Integral is compared with SIF obtained from the first coefficient of the Williams’ series. |
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ISSN: | 1757-8981 1757-899X |
DOI: | 10.1088/1757-899X/1038/1/012023 |