Investigation of pulsed laser deposited ZnO and TiO2 binary thin film nanostructures using electrochemical impedance spectroscopy

• Published in: Journal of materials science. Materials in electronics 2021-04, Vol.32 (8), p.11173-11182
• Main Authors: John Chelliah, Cyril Robinson Azariah, Immanuel, Sheebha, Swaminathan, Rajesh
• Format: Article
• Language: English
• Subjects: Characterization and Evaluation of Materials; Chemistry and Materials Science; Electrochemical impedance spectroscopy; Energy bands; Energy gap; Materials Science; Nanospheres; Optical and Electronic Materials; Pulsed laser deposition; Pulsed lasers; Software; Software development tools; Spectrum analysis; Thin films; Titanium dioxide; Zinc oxide
• ISSN: 0957-4522; 1573-482X
• DOI: 10.1007/s10854-021-05782-0

The paper presents the preparation of nanostructured ZnO and TiO 2 binary thin films by pulsed laser deposition at different temperatures ranging from 298 K (as deposited) to 923 K. The films have been characterized by SEM, EDAX, XRD, and UV. The presence of nanospheres is detected by SEM. The XRD spectra extrapolates the film's amorphous existence below 773 K. Thin film deposited at 923 K confirmed ZnTiO 3 formation. The optical energy band gap measured by the Tauc plot was found to be 3.7–3.9 eV. The electrochemical impedance spectroscopy with a sweeping frequency of 1 Hz to 1 MHz was used to examine the films for temperatures between 298 K and 473 K. The EIS results revealed that these films have not denied an impedance and modulus relaxation. Activation energy dependent on impedance and module relaxation was calculated from the Arrhenius plot. The mean capacitance was obtained and statistically tested using the SPSS statistics software tool.