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Effects of high-temperature thermal annealing on GeSn thin-film material and photodetector operating at 2 µm
•Ordered nanopatterns are formed on the surface of GeSn from high-temperature annealing (~700 °C).•Structural and optical properties of GeSn films before and after rapid thermal annealing are reported.•An increased photocurrent (>200%) is observed for the GeSn photodetector at an annealing temper...
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Published in: | Journal of alloys and compounds 2021-08, Vol.872, p.159696, Article 159696 |
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description | •Ordered nanopatterns are formed on the surface of GeSn from high-temperature annealing (~700 °C).•Structural and optical properties of GeSn films before and after rapid thermal annealing are reported.•An increased photocurrent (>200%) is observed for the GeSn photodetector at an annealing temperature of 550 °C at 2-µm wavelength.
Here, we explore the thermal stability of GeSn epilayers with varying Sn contents (3–10%) at an annealing temperature ranging from 300° to 750°C. It is found that ordered nanopatterns are formed on the surface of GeSn with Sn content of 8% without excessive Sn precipitation after thermal annealing at 700 °C. Despite being annealed at high temperatures, the GeSn maintains its crystal structure, which is confirmed by the X-ray Diffraction (XRD), Raman spectrum, and secondary-ion mass spectrometry (SIMS). The corresponding photocurrents of the photodetectors at the wavelength of 2 µm also indicate the crystal quality of the GeSn alloys does not deteriorate significantly after high-temperature annealing (675–700 °C). Meanwhile, the decrease of dark current with the enhancement of Ip/Id ratio (on-off ratio) indicates the improvement of detectivity of the photodetector due to the annealing process. Furthermore, the annealing temperature is optimized to 550 °C to achieve 200% enhancement of photocurrents of the GeSn photodetectors operated at 2 µm. |
doi_str_mv | 10.1016/j.jallcom.2021.159696 |
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Here, we explore the thermal stability of GeSn epilayers with varying Sn contents (3–10%) at an annealing temperature ranging from 300° to 750°C. It is found that ordered nanopatterns are formed on the surface of GeSn with Sn content of 8% without excessive Sn precipitation after thermal annealing at 700 °C. Despite being annealed at high temperatures, the GeSn maintains its crystal structure, which is confirmed by the X-ray Diffraction (XRD), Raman spectrum, and secondary-ion mass spectrometry (SIMS). The corresponding photocurrents of the photodetectors at the wavelength of 2 µm also indicate the crystal quality of the GeSn alloys does not deteriorate significantly after high-temperature annealing (675–700 °C). Meanwhile, the decrease of dark current with the enhancement of Ip/Id ratio (on-off ratio) indicates the improvement of detectivity of the photodetector due to the annealing process. Furthermore, the annealing temperature is optimized to 550 °C to achieve 200% enhancement of photocurrents of the GeSn photodetectors operated at 2 µm.</description><identifier>ISSN: 0925-8388</identifier><identifier>EISSN: 1873-4669</identifier><identifier>DOI: 10.1016/j.jallcom.2021.159696</identifier><language>eng</language><publisher>Lausanne: Elsevier B.V</publisher><subject>Annealing ; Crystal structure ; Crystals ; Dark current ; GeSn alloy ; High temperature ; Infrared photodetector ; Intermetallic compounds ; Nanopattern ; Photoelectric effect ; Photoelectric emission ; Photometers ; Secondary ion mass spectrometry ; Structural property ; Temperature ; Thermal stability ; Tin</subject><ispartof>Journal of alloys and compounds, 2021-08, Vol.872, p.159696, Article 159696</ispartof><rights>2021 Elsevier B.V.</rights><rights>Copyright Elsevier BV Aug 15, 2021</rights><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c2996-340c2b1b34b94985ca00faedb3a9eea80dd6b3e23c4525390d28ac1126d7275d3</citedby><cites>FETCH-LOGICAL-c2996-340c2b1b34b94985ca00faedb3a9eea80dd6b3e23c4525390d28ac1126d7275d3</cites><orcidid>0000-0002-7457-2269 ; 0000-0002-0624-7472</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,780,784,27924,27925</link.rule.ids></links><search><creatorcontrib>Wu, Shaoteng</creatorcontrib><creatorcontrib>Son, Bongkwon</creatorcontrib><creatorcontrib>Zhang, Lin</creatorcontrib><creatorcontrib>Chen, Qimiao</creatorcontrib><creatorcontrib>Zhou, Hao</creatorcontrib><creatorcontrib>Goh, Simon Chun Kiat</creatorcontrib><creatorcontrib>Tan, Chuan Seng</creatorcontrib><title>Effects of high-temperature thermal annealing on GeSn thin-film material and photodetector operating at 2 µm</title><title>Journal of alloys and compounds</title><description>•Ordered nanopatterns are formed on the surface of GeSn from high-temperature annealing (~700 °C).•Structural and optical properties of GeSn films before and after rapid thermal annealing are reported.•An increased photocurrent (>200%) is observed for the GeSn photodetector at an annealing temperature of 550 °C at 2-µm wavelength.
Here, we explore the thermal stability of GeSn epilayers with varying Sn contents (3–10%) at an annealing temperature ranging from 300° to 750°C. It is found that ordered nanopatterns are formed on the surface of GeSn with Sn content of 8% without excessive Sn precipitation after thermal annealing at 700 °C. Despite being annealed at high temperatures, the GeSn maintains its crystal structure, which is confirmed by the X-ray Diffraction (XRD), Raman spectrum, and secondary-ion mass spectrometry (SIMS). The corresponding photocurrents of the photodetectors at the wavelength of 2 µm also indicate the crystal quality of the GeSn alloys does not deteriorate significantly after high-temperature annealing (675–700 °C). Meanwhile, the decrease of dark current with the enhancement of Ip/Id ratio (on-off ratio) indicates the improvement of detectivity of the photodetector due to the annealing process. Furthermore, the annealing temperature is optimized to 550 °C to achieve 200% enhancement of photocurrents of the GeSn photodetectors operated at 2 µm.</description><subject>Annealing</subject><subject>Crystal structure</subject><subject>Crystals</subject><subject>Dark current</subject><subject>GeSn alloy</subject><subject>High temperature</subject><subject>Infrared photodetector</subject><subject>Intermetallic compounds</subject><subject>Nanopattern</subject><subject>Photoelectric effect</subject><subject>Photoelectric emission</subject><subject>Photometers</subject><subject>Secondary ion mass spectrometry</subject><subject>Structural property</subject><subject>Temperature</subject><subject>Thermal stability</subject><subject>Tin</subject><issn>0925-8388</issn><issn>1873-4669</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2021</creationdate><recordtype>article</recordtype><recordid>eNqFkE1OwzAQhS0EEqVwBCRLrFP8k6TxCqGqFKRKLIC15diT1lESB8dFYseNWHEBjsJJcBv2LEazmPfe6H0IXVIyo4Tm1_WsVk2jXTtjhNEZzUQu8iM0ocWcJ2mei2M0IYJlScGL4hSdDUNNCKGC0wlyy6oCHQbsKry1m20SoO3Bq7DzgMMWfKsarLoOVGO7DXYdXsFTFy-2SyrbtLhVAbw9iAzuty44AyEmOo_dIWhvUwGzn4_P76_2HJ1Uqhng4m9P0cvd8nlxn6wfVw-L23WimRB5wlOiWUlLnpYiFUWmFSGVAlNyJQBUQYzJSw6M6zRjGRfEsEJpSllu5myeGT5FV2Nu793rDoYga7fzXXwpo35O40Q6U5SNKu3dMHioZO9tq_y7pETu2cpa_rGVe7ZyZBt9N6MPYoU3C14O2kKnwVgfu0vj7D8Jv2bth7U</recordid><startdate>20210815</startdate><enddate>20210815</enddate><creator>Wu, Shaoteng</creator><creator>Son, Bongkwon</creator><creator>Zhang, Lin</creator><creator>Chen, Qimiao</creator><creator>Zhou, Hao</creator><creator>Goh, Simon Chun Kiat</creator><creator>Tan, Chuan Seng</creator><general>Elsevier B.V</general><general>Elsevier BV</general><scope>AAYXX</scope><scope>CITATION</scope><scope>8BQ</scope><scope>8FD</scope><scope>JG9</scope><orcidid>https://orcid.org/0000-0002-7457-2269</orcidid><orcidid>https://orcid.org/0000-0002-0624-7472</orcidid></search><sort><creationdate>20210815</creationdate><title>Effects of high-temperature thermal annealing on GeSn thin-film material and photodetector operating at 2 µm</title><author>Wu, Shaoteng ; Son, Bongkwon ; Zhang, Lin ; Chen, Qimiao ; Zhou, Hao ; Goh, Simon Chun Kiat ; Tan, Chuan Seng</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c2996-340c2b1b34b94985ca00faedb3a9eea80dd6b3e23c4525390d28ac1126d7275d3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2021</creationdate><topic>Annealing</topic><topic>Crystal structure</topic><topic>Crystals</topic><topic>Dark current</topic><topic>GeSn alloy</topic><topic>High temperature</topic><topic>Infrared photodetector</topic><topic>Intermetallic compounds</topic><topic>Nanopattern</topic><topic>Photoelectric effect</topic><topic>Photoelectric emission</topic><topic>Photometers</topic><topic>Secondary ion mass spectrometry</topic><topic>Structural property</topic><topic>Temperature</topic><topic>Thermal stability</topic><topic>Tin</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Wu, Shaoteng</creatorcontrib><creatorcontrib>Son, Bongkwon</creatorcontrib><creatorcontrib>Zhang, Lin</creatorcontrib><creatorcontrib>Chen, Qimiao</creatorcontrib><creatorcontrib>Zhou, Hao</creatorcontrib><creatorcontrib>Goh, Simon Chun Kiat</creatorcontrib><creatorcontrib>Tan, Chuan Seng</creatorcontrib><collection>CrossRef</collection><collection>METADEX</collection><collection>Technology Research Database</collection><collection>Materials Research Database</collection><jtitle>Journal of alloys and compounds</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Wu, Shaoteng</au><au>Son, Bongkwon</au><au>Zhang, Lin</au><au>Chen, Qimiao</au><au>Zhou, Hao</au><au>Goh, Simon Chun Kiat</au><au>Tan, Chuan Seng</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Effects of high-temperature thermal annealing on GeSn thin-film material and photodetector operating at 2 µm</atitle><jtitle>Journal of alloys and compounds</jtitle><date>2021-08-15</date><risdate>2021</risdate><volume>872</volume><spage>159696</spage><pages>159696-</pages><artnum>159696</artnum><issn>0925-8388</issn><eissn>1873-4669</eissn><abstract>•Ordered nanopatterns are formed on the surface of GeSn from high-temperature annealing (~700 °C).•Structural and optical properties of GeSn films before and after rapid thermal annealing are reported.•An increased photocurrent (>200%) is observed for the GeSn photodetector at an annealing temperature of 550 °C at 2-µm wavelength.
Here, we explore the thermal stability of GeSn epilayers with varying Sn contents (3–10%) at an annealing temperature ranging from 300° to 750°C. It is found that ordered nanopatterns are formed on the surface of GeSn with Sn content of 8% without excessive Sn precipitation after thermal annealing at 700 °C. Despite being annealed at high temperatures, the GeSn maintains its crystal structure, which is confirmed by the X-ray Diffraction (XRD), Raman spectrum, and secondary-ion mass spectrometry (SIMS). The corresponding photocurrents of the photodetectors at the wavelength of 2 µm also indicate the crystal quality of the GeSn alloys does not deteriorate significantly after high-temperature annealing (675–700 °C). Meanwhile, the decrease of dark current with the enhancement of Ip/Id ratio (on-off ratio) indicates the improvement of detectivity of the photodetector due to the annealing process. Furthermore, the annealing temperature is optimized to 550 °C to achieve 200% enhancement of photocurrents of the GeSn photodetectors operated at 2 µm.</abstract><cop>Lausanne</cop><pub>Elsevier B.V</pub><doi>10.1016/j.jallcom.2021.159696</doi><orcidid>https://orcid.org/0000-0002-7457-2269</orcidid><orcidid>https://orcid.org/0000-0002-0624-7472</orcidid><oa>free_for_read</oa></addata></record> |
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subjects | Annealing Crystal structure Crystals Dark current GeSn alloy High temperature Infrared photodetector Intermetallic compounds Nanopattern Photoelectric effect Photoelectric emission Photometers Secondary ion mass spectrometry Structural property Temperature Thermal stability Tin |
title | Effects of high-temperature thermal annealing on GeSn thin-film material and photodetector operating at 2 µm |
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