Spectroscopic ellipsometry of large area monolayer WS2 and WSe2 films

In the present study, we report on dispersion function over a spectral range of 300 – 1700 nm (i.e. 0.73 – 4.13eV) for CVD-grown full area coverage monolayer WS2 and WSe2 films on SiO2/Si substrates. The result is obtained via the analysis of spectroscopic ellipsometry spectra by virtue of Tauc-Lore...

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Bibliographic Details
Main Authors: Ermolaev, G. A., Yakubovsky, D. I., Stebunov, Y. V., Voronov, A. A., Arsenin, A. V., Volkov, V. S.
Format: Conference Proceeding
Language:English
Subjects:
Excitons
Monolayers
Oscillators
Silicon dioxide
Silicon substrates
Spectroellipsometry
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Summary:In the present study, we report on dispersion function over a spectral range of 300 – 1700 nm (i.e. 0.73 – 4.13eV) for CVD-grown full area coverage monolayer WS2 and WSe2 films on SiO2/Si substrates. The result is obtained via the analysis of spectroscopic ellipsometry spectra by virtue of Tauc-Lorentz oscillators, which takes into account that absorption of these materials are attributed to the formation of the excitons.
ISSN:0094-243X
1551-7616
DOI:10.1063/5.0054947