Effect of diode laser‐assisted bleaching on the bond strength of different adhesive systems to enamel: Interfacial SEM analysis

The aim of this study was to investigate the effectiveness of diode laser‐assisted bleaching on the shear bond strength (SBS) of different adhesive systems to enamel and examine the adhesive enamel interface under scanning electron microscope (SEM). 180 incisor teeth were randomly divided into three...

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Bibliographic Details
Published in:Microscopy research and technique 2021-07, Vol.84 (7), p.1542-1552
Main Authors: Cevval Ozkocak, Begum Busra, Aytac Bal, Fatma
Format: Article
Language:English
Subjects:
Adhesion
Adhesive bonding
Adhesive strength
Adhesives
Bleaching
Bond strength
Bonding strength
Carbamide Peroxide
Composite materials
Composite Resins
Dental Bonding
Dental Enamel
diode laser
Enamel
Humans
Hydrogen peroxide
Incisor
Lasers
Lasers, Semiconductor
Opalescence
Peroxides
power bleaching
Resin Cements
Scanning electron microscopy
Semiconductor lasers
Subgroups
Teeth
Tooth Bleaching
universal adhesive
Urea
Variance analysis
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Summary:The aim of this study was to investigate the effectiveness of diode laser‐assisted bleaching on the shear bond strength (SBS) of different adhesive systems to enamel and examine the adhesive enamel interface under scanning electron microscope (SEM). 180 incisor teeth were randomly divided into three bleaching groups: (1) Unbleached control group, (2) Opalescence Boost (OB) 40%, and (3) Diode laser‐assisted LaserWhite20 (LW20) 45%. After bleaching, each group was divided into two subgroups according to waiting time: immediately or 7 days' delay. The six groups were then divided into three subgroups based on the adhesive procedure: Single Bond 2 (SB2), Clearfil SE Bond (CSB), and Clearfil Universal Bond (CUB). After adhesive procedures, composite resin cylinders were bonded to the enamel surfaces. All specimens were subjected to a SBS test after 24 hr of storage in water. Data were analysed using three‐way variance analysis (p 
ISSN:1059-910X
1097-0029
DOI:10.1002/jemt.23711