A Survey of Analog-to-Digital Converters for Operation under Radiation Environments

In this work, we analyze in depth multiple characteristic data of a representative population of radenv-ADCs (analog-to-digital converters able to operate under radiation). Selected ADCs behave without latch-up below 50 MeV·cm2/mg and are able to bear doses of ionizing radiation above 50 krad(Si). A...

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Bibliographic Details
Published in:Electronics (Basel) 2020-10, Vol.9 (10), p.1694
Main Authors: Pun-García, Ernesto, López-Vallejo, Marisa
Format: Article
Language:English
Subjects:
Analog to digital conversion
Analog to digital converters
Circuit design
Design and construction
Efficiency
Influence
Ionizing radiation
Latch-up
Manufacturing
Methods
Noise
Performance evaluation
Radiation
Semiconductors
Silicon
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Summary:In this work, we analyze in depth multiple characteristic data of a representative population of radenv-ADCs (analog-to-digital converters able to operate under radiation). Selected ADCs behave without latch-up below 50 MeV·cm2/mg and are able to bear doses of ionizing radiation above 50 krad(Si). An exhaustive search of ADCs with radiation characterization data has been carried out throughout the literature. The obtained collection is analyzed and compared against the state of the art of scientific ADCs, which reached years ago the electrical performance that radenv-ADCs provide nowadays. In fact, for a given Nyquist sampling rate, radenv-ADCs require significantly more power to achieve lower effective resolution. The extracted performance patterns and conclusions from our study aim to serve as reference for new developments towards more efficient implementations. As tools for this purpose, we have conceived FOMTID and FOMSET, two new figures of merit to compare radenv-ADCs that consider electrical and radiation performance.
ISSN:2079-9292
2079-9292
DOI:10.3390/electronics9101694