The Impact of UV Photoelectron Spectroscopy on the Field of Organic Optoelectronics—A Retrospective

The field of organic electronics has been of widespread interest for a long time. Over the years, device efficiencies increased steadily due to the development of new materials, as well as an improved understanding of the physical mechanisms governing underlying fundamental processes such as charge...

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Bibliographic Details
Published in:Advanced optical materials 2021-07, Vol.9 (14), p.n/a
Main Author: Olthof, Selina
Format: Article
Language:English
Subjects:
Carrier recombination
Charge transport
Current carriers
doping
energy level alignment
Energy levels
history
interface dipoles
interfaces
Materials science
Optics
Optoelectronics
Organic semiconductors
Photoelectron spectroscopy
Photoelectrons
Spectrum analysis
Thin films
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Summary:The field of organic electronics has been of widespread interest for a long time. Over the years, device efficiencies increased steadily due to the development of new materials, as well as an improved understanding of the physical mechanisms governing underlying fundamental processes such as charge transport or charge carrier generation and recombination. Especially the positions of energy levels that are responsible for the charge transport throughout a device are of paramount importance. This generated a high demand for reliably measured values. The most important technique that can directly access these values in a thin film is photoelectron spectroscopy. The very fruitful collaboration between surface scientists and device specialists is ​ reviewed here, showing a range of experiments through which UV photoelectron spectroscopy helped to unravel the working mechanisms of organic semiconductors in devices. UV photoelectron spectroscopy is a powerful tool to investigate energy levels of organic semiconductors that are used in organic optoelectronic devices. In addition, interface formation between different materials can be probed. By combining these findings with device characteristics, it is possible to better understand device functionality.
ISSN:2195-1071
2195-1071
DOI:10.1002/adom.202100227