Space-Charge-Limited Current Injection Into Free Space and Trap-Filled Solid

We present a model of the space charge limited (SCL) electron injection into a gap combined with trap-filled dielectric solid and vacuum or a gap combined with two different trap-filled dielectric solid. An optimized calculation method is proposed to calculate the SCL current density J inside the...

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Bibliographic Details
Published in:IEEE transactions on plasma science 2021-07, Vol.49 (7), p.2107-2112
Main Authors: Zhu, Ying Bin, Geng, Kuiwei, Cheng, Zheng Shan, Yao, Ruo He
Format: Article
Language:English
Subjects:
Current density
Current injection
Dielectrics
Electric potential
Electron injection
Electron mobility
Electron transport
Electron traps
Injection
Polymers
Solid modeling
Solids
Space charge
space-charge-limited (SCL) current
Transport properties
trap
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Summary:We present a model of the space charge limited (SCL) electron injection into a gap combined with trap-filled dielectric solid and vacuum or a gap combined with two different trap-filled dielectric solid. An optimized calculation method is proposed to calculate the SCL current density J inside the gap under different gap voltages V_{g} . The n scaling of J - V_{g}^{n} varies in a different range of V_{g} , which is described as the Ohm regime, trap-limited regime, and SCL regime. It is found that the n scaling is dependent on electron mobility and relative length scale between two media, which indicates that traps in the dielectric have a profound impact on SCL electron transport properties.
ISSN:0093-3813
1939-9375
DOI:10.1109/TPS.2021.3084461