Study of the Transport Properties and Domain Structure of Thin CoPt Films Obtained by Electron Evaporation

—CoPt films obtained by electron beam evaporation with deposition of ten Co and Pt bilayers with a total thickness of 8 nm are experimentally investigated. The Hall effect and longitudinal magnetoresistance measurements were carried out with a temperature change from 8 to 300 K. At room temperature,...

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Bibliographic Details
Published in:Journal of communications technology & electronics 2021-07, Vol.66 (7), p.868-872
Main Authors: Stepushkin, M. V., Sizov, V. E., Zdoroveishchev, A. V., Kalentieva, I. L., Mirgorodskaya, E. N., Temiryazev, A. G., Temiryazeva, M. P.
Format: Article
Language:English
Subjects:
Atomic force microscopes
Atomic force microscopy
Cobalt base alloys
Cobalt compounds
Communications Engineering
Electromagnetism
Electron beams
Engineering
Evaporation
Ferromagnetism
Hall effect
Intermetallic compounds
Magnetic domains
Magnetic fields
Magnetism
Magnetization
Magnetization reversal
Magnetoresistance
Magnetoresistivity
Nanoelectronics
Networks
Platinum compounds
Room temperature
Thin films
Transport properties
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Summary:—CoPt films obtained by electron beam evaporation with deposition of ten Co and Pt bilayers with a total thickness of 8 nm are experimentally investigated. The Hall effect and longitudinal magnetoresistance measurements were carried out with a temperature change from 8 to 300 K. At room temperature, using magnetic force microscopy, images of domain structures corresponding to different points of the magnetization reversal curve were obtained. The possibility of studying the Hall effect on artificially created domain structures formed by the local magnetic field of the probe of an atomic force microscope is demonstrated.
ISSN:1064-2269
1555-6557
DOI:10.1134/S1064226921070111