Low-Cost Direct Electron Detection in the SEM for EBSD and ECCI

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Bibliographic Details
Published in:Microscopy and microanalysis 2021-08, Vol.27 (S1), p.998-999
Main Authors: Tessmer, Joseph, Graef, Marc De
Format: Article
Language:English
Subjects:
Analytical Sciences Symposia
Diffraction Imaging Across Disciplines
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ISSN:1431-9276
1435-8115
DOI:10.1017/S1431927621003780