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Analysis of superconducting thin films in a modern FIB/SEM dual-beam instrument

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Bibliographic Details
Published in:	Microscopy and microanalysis 2021-08, Vol.27 (S1), p.1056-1058
Main Authors:	Grünewald, Lukas, Nerz, Daniel, Langer, Marco, Meyer, Sven, Beisig, Nico, Cayado, Pablo, Popov, Ruslan, Hänisch, Jens, Holzapfel, Bernhard, Gerthsen, Dagmar
Format:	Article
Language:	English
Subjects:	Advances in Analytical STEM-in-SEM Analytical chemistry Analytical Sciences Symposia Microscopy Principal components analysis Spectrum analysis Thin films
Citations:	Items that this one cites
Online Access:	Get full text
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