Experimental characterization of alpha spectrometer for optimization of operational parameters affecting energy resolution and detection efficiency

The operational parameters of an alpha spectrometer equipped with a planar silicon semiconductor detector were characterized by measuring a mixed alpha source. The full width at half maximum (FWHM) decreased with increasing conversion gain (CG) and sample-to-detector distance (SDD) and was constant...

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Bibliographic Details
Published in:Journal of radioanalytical and nuclear chemistry 2021-08, Vol.329 (2), p.959-967
Main Authors: Ryu, Jeonghyeon, Park, Ji-young, Lee, Hyeon-Woo, Kim, Hyuncheol, Chae, Jung-Seok
Format: Article
Language:English
Subjects:
Analysis
Chemistry
Chemistry and Materials Science
Detectors
Diagnostic Radiology
Energy conversion efficiency
Energy resolution
Error detection
Hadrons
Heavy Ions
Inorganic Chemistry
Nuclear Chemistry
Nuclear energy
Nuclear Physics
Optimization
Parameters
Physical Chemistry
Spectrum analysis
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Summary:The operational parameters of an alpha spectrometer equipped with a planar silicon semiconductor detector were characterized by measuring a mixed alpha source. The full width at half maximum (FWHM) decreased with increasing conversion gain (CG) and sample-to-detector distance (SDD) and was constant beyond an SDD of 21 mm. Although the FWHM was minimum at 4096 CG, peak-shape analysis showed that 1024 CG and 2048 CG are more appropriate than 4096 CG for alpha spectrum analysis. In practical measurement with SDD less than 5 mm, a sample thickness difference of 1 mm caused a relative error in detection efficiency of 11 %.
ISSN:0236-5731
1588-2780
DOI:10.1007/s10967-021-07821-w