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Analysis of Short-circuit and Protection Failure Risk Considering Random Output of Distributed Photovoltaics

Distributed photovoltaics (DPV) will increase or shunt the fault current as a branch of the power supply. The random outputs of DPV will also cause a random distribution of fault current, while the breaking capacity of the breaker and the setting value of the current protection is pre-set value, and...

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Published in:IOP conference series. Earth and environmental science 2017-05, Vol.63 (1), p.12004
Main Authors: Da, Yao, Huan, Zhang, Wei, Deng
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description Distributed photovoltaics (DPV) will increase or shunt the fault current as a branch of the power supply. The random outputs of DPV will also cause a random distribution of fault current, while the breaking capacity of the breaker and the setting value of the current protection is pre-set value, and cannot flexibly change, so DPV will bring a certain degree of influence on the breaking margin and the sensitivity of protection. This paper makes probability distribution calculating model of fault current containing DPV, and takes IEEE 33-node system as an example, simulated the probability distribution of fault current at different penetration of DPV. Finally, from the two indicators of the breaking margin of breaker and the sensitivity of protection, analysed the protection failure risk after the access of DPV.
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fullrecord <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_journals_2560083199</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>2560083199</sourcerecordid><originalsourceid>FETCH-LOGICAL-c350t-61bf33a239aea3386509a68f3f147b2806e89b52b4dc5ab5cd3c1716f3065fb93</originalsourceid><addsrcrecordid>eNqFkNFKwzAUhoMoOKePIAS88Ko2aZa0vRxzU2Ew2fQ6pGniMrumJqmwt7elMr0QvDqHw_99cH4ArjG6wyjLYpxSGmGCacxIjGOEE4QmJ2B0vJ8ed5SegwvvdwixdELyEaimtagO3nhoNdxsrQuRNE62JkBRl_DZ2aBkMLaGC2Gq1im4Nv4dzmztTamcqd_gugvaPVy1oWlDr7k3PjhTtEF1gq0N9tNWQRjpL8GZFpVXV99zDF4X85fZY7RcPTzNpstIEopCxHChCREJyYUShGSMolywTBONJ2mRZIipLC9oUkxKSUVBZUkkTjHTBDGqi5yMwc3gbZz9aJUPfGdb1z3qeUIZQhnBeZ-iQ0o6671TmjfO7IU7cIx4XyzvS-N9gZwRjvlQbMfhgTO2-RH_x9z-wcznm98p3pSafAG-w4eU</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>2560083199</pqid></control><display><type>article</type><title>Analysis of Short-circuit and Protection Failure Risk Considering Random Output of Distributed Photovoltaics</title><source>Publicly Available Content Database</source><creator>Da, Yao ; Huan, Zhang ; Wei, Deng</creator><creatorcontrib>Da, Yao ; Huan, Zhang ; Wei, Deng</creatorcontrib><description>Distributed photovoltaics (DPV) will increase or shunt the fault current as a branch of the power supply. The random outputs of DPV will also cause a random distribution of fault current, while the breaking capacity of the breaker and the setting value of the current protection is pre-set value, and cannot flexibly change, so DPV will bring a certain degree of influence on the breaking margin and the sensitivity of protection. This paper makes probability distribution calculating model of fault current containing DPV, and takes IEEE 33-node system as an example, simulated the probability distribution of fault current at different penetration of DPV. Finally, from the two indicators of the breaking margin of breaker and the sensitivity of protection, analysed the protection failure risk after the access of DPV.</description><identifier>ISSN: 1755-1307</identifier><identifier>EISSN: 1755-1315</identifier><identifier>DOI: 10.1088/1755-1315/63/1/012004</identifier><language>eng</language><publisher>Bristol: IOP Publishing</publisher><subject>Failure analysis ; Photovoltaic cells ; Photovoltaics ; Probability distribution ; Sensitivity analysis ; Short circuits</subject><ispartof>IOP conference series. Earth and environmental science, 2017-05, Vol.63 (1), p.12004</ispartof><rights>Published under licence by IOP Publishing Ltd</rights><rights>2017. This work is published under http://creativecommons.org/licenses/by/3.0/ (the “License”). Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License.</rights><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://www.proquest.com/docview/2560083199?pq-origsite=primo$$EHTML$$P50$$Gproquest$$Hfree_for_read</linktohtml><link.rule.ids>314,776,780,25731,27901,27902,36989,44566</link.rule.ids></links><search><creatorcontrib>Da, Yao</creatorcontrib><creatorcontrib>Huan, Zhang</creatorcontrib><creatorcontrib>Wei, Deng</creatorcontrib><title>Analysis of Short-circuit and Protection Failure Risk Considering Random Output of Distributed Photovoltaics</title><title>IOP conference series. Earth and environmental science</title><addtitle>IOP Conf. Ser.: Earth Environ. Sci</addtitle><description>Distributed photovoltaics (DPV) will increase or shunt the fault current as a branch of the power supply. The random outputs of DPV will also cause a random distribution of fault current, while the breaking capacity of the breaker and the setting value of the current protection is pre-set value, and cannot flexibly change, so DPV will bring a certain degree of influence on the breaking margin and the sensitivity of protection. This paper makes probability distribution calculating model of fault current containing DPV, and takes IEEE 33-node system as an example, simulated the probability distribution of fault current at different penetration of DPV. Finally, from the two indicators of the breaking margin of breaker and the sensitivity of protection, analysed the protection failure risk after the access of DPV.</description><subject>Failure analysis</subject><subject>Photovoltaic cells</subject><subject>Photovoltaics</subject><subject>Probability distribution</subject><subject>Sensitivity analysis</subject><subject>Short circuits</subject><issn>1755-1307</issn><issn>1755-1315</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2017</creationdate><recordtype>article</recordtype><sourceid>PIMPY</sourceid><recordid>eNqFkNFKwzAUhoMoOKePIAS88Ko2aZa0vRxzU2Ew2fQ6pGniMrumJqmwt7elMr0QvDqHw_99cH4ArjG6wyjLYpxSGmGCacxIjGOEE4QmJ2B0vJ8ed5SegwvvdwixdELyEaimtagO3nhoNdxsrQuRNE62JkBRl_DZ2aBkMLaGC2Gq1im4Nv4dzmztTamcqd_gugvaPVy1oWlDr7k3PjhTtEF1gq0N9tNWQRjpL8GZFpVXV99zDF4X85fZY7RcPTzNpstIEopCxHChCREJyYUShGSMolywTBONJ2mRZIipLC9oUkxKSUVBZUkkTjHTBDGqi5yMwc3gbZz9aJUPfGdb1z3qeUIZQhnBeZ-iQ0o6671TmjfO7IU7cIx4XyzvS-N9gZwRjvlQbMfhgTO2-RH_x9z-wcznm98p3pSafAG-w4eU</recordid><startdate>20170501</startdate><enddate>20170501</enddate><creator>Da, Yao</creator><creator>Huan, Zhang</creator><creator>Wei, Deng</creator><general>IOP Publishing</general><scope>O3W</scope><scope>TSCCA</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>ABUWG</scope><scope>AEUYN</scope><scope>AFKRA</scope><scope>ATCPS</scope><scope>AZQEC</scope><scope>BENPR</scope><scope>BHPHI</scope><scope>CCPQU</scope><scope>DWQXO</scope><scope>GNUQQ</scope><scope>HCIFZ</scope><scope>PATMY</scope><scope>PIMPY</scope><scope>PQEST</scope><scope>PQQKQ</scope><scope>PQUKI</scope><scope>PYCSY</scope></search><sort><creationdate>20170501</creationdate><title>Analysis of Short-circuit and Protection Failure Risk Considering Random Output of Distributed Photovoltaics</title><author>Da, Yao ; Huan, Zhang ; Wei, Deng</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c350t-61bf33a239aea3386509a68f3f147b2806e89b52b4dc5ab5cd3c1716f3065fb93</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2017</creationdate><topic>Failure analysis</topic><topic>Photovoltaic cells</topic><topic>Photovoltaics</topic><topic>Probability distribution</topic><topic>Sensitivity analysis</topic><topic>Short circuits</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Da, Yao</creatorcontrib><creatorcontrib>Huan, Zhang</creatorcontrib><creatorcontrib>Wei, Deng</creatorcontrib><collection>IOP Publishing Free Content</collection><collection>IOPscience (Open Access)</collection><collection>CrossRef</collection><collection>ProQuest Central (Alumni)</collection><collection>ProQuest One Sustainability</collection><collection>ProQuest Central</collection><collection>Agricultural &amp; Environmental Science Collection</collection><collection>ProQuest Central Essentials</collection><collection>ProQuest Central</collection><collection>Natural Science Collection</collection><collection>ProQuest One Community College</collection><collection>ProQuest Central</collection><collection>ProQuest Central Student</collection><collection>SciTech Premium Collection</collection><collection>Environmental Science Database</collection><collection>Publicly Available Content Database</collection><collection>ProQuest One Academic Eastern Edition (DO NOT USE)</collection><collection>ProQuest One Academic</collection><collection>ProQuest One Academic UKI Edition</collection><collection>Environmental Science Collection</collection><jtitle>IOP conference series. Earth and environmental science</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Da, Yao</au><au>Huan, Zhang</au><au>Wei, Deng</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Analysis of Short-circuit and Protection Failure Risk Considering Random Output of Distributed Photovoltaics</atitle><jtitle>IOP conference series. Earth and environmental science</jtitle><addtitle>IOP Conf. Ser.: Earth Environ. Sci</addtitle><date>2017-05-01</date><risdate>2017</risdate><volume>63</volume><issue>1</issue><spage>12004</spage><pages>12004-</pages><issn>1755-1307</issn><eissn>1755-1315</eissn><abstract>Distributed photovoltaics (DPV) will increase or shunt the fault current as a branch of the power supply. The random outputs of DPV will also cause a random distribution of fault current, while the breaking capacity of the breaker and the setting value of the current protection is pre-set value, and cannot flexibly change, so DPV will bring a certain degree of influence on the breaking margin and the sensitivity of protection. This paper makes probability distribution calculating model of fault current containing DPV, and takes IEEE 33-node system as an example, simulated the probability distribution of fault current at different penetration of DPV. Finally, from the two indicators of the breaking margin of breaker and the sensitivity of protection, analysed the protection failure risk after the access of DPV.</abstract><cop>Bristol</cop><pub>IOP Publishing</pub><doi>10.1088/1755-1315/63/1/012004</doi><tpages>6</tpages><oa>free_for_read</oa></addata></record>
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subjects Failure analysis
Photovoltaic cells
Photovoltaics
Probability distribution
Sensitivity analysis
Short circuits
title Analysis of Short-circuit and Protection Failure Risk Considering Random Output of Distributed Photovoltaics
url http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-06T02%3A58%3A51IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Analysis%20of%20Short-circuit%20and%20Protection%20Failure%20Risk%20Considering%20Random%20Output%20of%20Distributed%20Photovoltaics&rft.jtitle=IOP%20conference%20series.%20Earth%20and%20environmental%20science&rft.au=Da,%20Yao&rft.date=2017-05-01&rft.volume=63&rft.issue=1&rft.spage=12004&rft.pages=12004-&rft.issn=1755-1307&rft.eissn=1755-1315&rft_id=info:doi/10.1088/1755-1315/63/1/012004&rft_dat=%3Cproquest_cross%3E2560083199%3C/proquest_cross%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-c350t-61bf33a239aea3386509a68f3f147b2806e89b52b4dc5ab5cd3c1716f3065fb93%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_pqid=2560083199&rft_id=info:pmid/&rfr_iscdi=true