Effect of layer thickness on structural, morphological and superconducting properties of Nb3Sn films fabricated by multilayer sequential sputtering

• Main Authors: Sayeed, M N, Pudasaini, U, Reece, C E, Eremeev, G V, Elsayed-Ali, H E
• Format: Conference Proceeding
• Language: English
• Subjects: Annealing; Atomic force microscopy; Composition; Critical temperature; Crystal structure; High temperature; Microscopy; Morphology; Multilayers; Sapphire; Sputtering; Substrates; Superconductivity; Thickness; Thin films
• ISSN: 1757-8981; 1757-899X
• DOI: 10.1088/1757-899X/756/1/012014

Superconducting Nb3Sn films can be synthesized by controlling the atomic concentration of Sn. Multilayer sequential sputtering of Nb and Sn thin films followed by high temperature annealing is considered as a method to fabricate Nb3Sn films, where the Sn composition of the deposited films can be controlled by the thickness of alternating Nb and Sn layers. We report on the structural, morphological and superconducting properties of Nb3Sn films fabricated by multilayer sequential sputtering of Nb and Sn films on sapphire substrates followed by annealing at 950 °C for 3 h. We have investigated the effect of Nb and Sn layer thickness and Nb:Sn ratio on the properties of the Nb3Sn films. The crystal structure, surface morphology, surface topography, and film composition were characterized by X-ray diffraction (XRD), scanning electron microscopy (SEM), atomic force microscopy (AFM), and energy dispersive X-ray spectroscopy (EDS). The results showed Sn loss from the surface due to evaporation during annealing. Superconducting Nb3Sn films of critical temperature up to 17.93 K were fabricated.