Investigation of phases and textures of binary V-Si coating deposited on vanadium-based alloy (V-4Cr-4Ti) using electron backscatter diffraction

Barrier coating consisting of binary silicide compounds SixVy were deposited on a V-4Cr-4Ti vanadium alloy substrate. Samples were cycled in a furnace for 122h at 650°C and 1100°C. The electron backscattered (EBSD) combine with X-ray energy dispersive spectrometry (EDS) techniques were employed to i...

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Bibliographic Details
Published in:IOP conference series. Materials Science and Engineering 2015-04, Vol.82 (1), p.12061
Main Authors: Nowakowski, P, Ubhi, H S, Mathieu, S
Format: Article
Language:English
Subjects:
Crystal structure
Electron backscatter diffraction
Engineering Sciences
Multilayers
Orientation relationships
Protective coatings
Silicides
Silicon
Substrates
Vanadium base alloys
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Summary:Barrier coating consisting of binary silicide compounds SixVy were deposited on a V-4Cr-4Ti vanadium alloy substrate. Samples were cycled in a furnace for 122h at 650°C and 1100°C. The electron backscattered (EBSD) combine with X-ray energy dispersive spectrometry (EDS) techniques were employed to identify the phases in the multi-layered coating and to determine growth texture for each phase. The microstructure evolutions occurringduring cycling at 1100°C in the protective coating and the crystal orientation relationships between SixVy were determined.
ISSN:1757-8981
1757-899X
1757-899X
DOI:10.1088/1757-899X/82/1/012061