The electronic component authenticity verification

The article presents a brief insight into the university research of efficient methods aimed at revealing counterfeit electronic components. Methods like multichannel curve tracing, component internal structure X-raying, system on chip optical inspection with higher magnification microscopy and Scan...

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Bibliographic Details
Published in:Journal of physics. Conference series 2018-08, Vol.1065 (10), p.102014
Main Authors: Neumann, P, Navrátil, M, Pospíšilík, M, Křesálek, V, Adámek, M
Format: Article
Language:English
Subjects:
Counterfeit
Electronic components
Inspection
Microscopy
Physics
System on chip
Verification
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Summary:The article presents a brief insight into the university research of efficient methods aimed at revealing counterfeit electronic components. Methods like multichannel curve tracing, component internal structure X-raying, system on chip optical inspection with higher magnification microscopy and Scanning Electron Microscopy combined with Element Energy Dispersive Spectroscopy (EDS) are powerful means for authenticity verification. Comparative analysis results serve as an illustration of cases where various features differences can warn not to let a particular component delivery penetrate the assembly process.
ISSN:1742-6588
1742-6596
DOI:10.1088/1742-6596/1065/10/102014