M-X-ray emission in interaction of slow highly charged Xeq+ ions (q=26-40) with metallic foils

Synopsis Emission of M-X-rays in interaction of slow highly charged Xeq+ ions, delivered by electron beam ion source (EBIS), with metallic surfaces was studied. Measured M-X-ray spectra for different charge states give access to interpret both the dynamics of neutralization of highly charged ions at...

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Bibliographic Details
Published in:Journal of physics. Conference series 2017-07, Vol.875 (12)
Main Authors: Jabłoński, Ł., Banaś, D., Braziewicz, J., Czub, J., Jagodziński, P., Kubala-Kukuś, A., Sobota, D., Stabrawa, I., Pajek, M.
Format: Article
Language:English
Subjects:
Atomic structure
Electron beams
Emission
Foils
Hollow atoms
Ion sources
Ions
Physics
X ray spectra
X-rays
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Summary:Synopsis Emission of M-X-rays in interaction of slow highly charged Xeq+ ions, delivered by electron beam ion source (EBIS), with metallic surfaces was studied. Measured M-X-ray spectra for different charge states give access to interpret both the dynamics of neutralization of highly charged ions at surfaces and relaxation processes of hollow atoms formed in this process. The measured spectra are interpreted in terms of the performed atomic structure calculations using the GRASP code.
ISSN:1742-6588
1742-6596
DOI:10.1088/1742-6596/875/12/112009