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Electron beam diagnostics tool based on Cherenkov radiation in optical fibers

The results of experimental investigations of Cherenkov radiation in optical fibers with 0.6 mm thickness which were used to scan an electron beam of 5.7 MeV energy are presented. Using such a technique for beam profile measurements it is possible to create a compact and reliable device compared to...

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Published in:Journal of physics. Conference series 2016-07, Vol.732 (1), p.12011
Main Authors: Vukolov, A V, Novokshonov, A I, Potylitsyn, A P, Uglov, S R
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Language:English
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cited_by cdi_FETCH-LOGICAL-c408t-c9d32a5313c743a0446ce15364fd077311d1d126fbac1874f550d8eb40892ec33
cites cdi_FETCH-LOGICAL-c408t-c9d32a5313c743a0446ce15364fd077311d1d126fbac1874f550d8eb40892ec33
container_end_page
container_issue 1
container_start_page 12011
container_title Journal of physics. Conference series
container_volume 732
creator Vukolov, A V
Novokshonov, A I
Potylitsyn, A P
Uglov, S R
description The results of experimental investigations of Cherenkov radiation in optical fibers with 0.6 mm thickness which were used to scan an electron beam of 5.7 MeV energy are presented. Using such a technique for beam profile measurements it is possible to create a compact and reliable device compared to existing systems based on ionization chambers.
doi_str_mv 10.1088/1742-6596/732/1/012011
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fullrecord <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_journals_2575157997</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>2575157997</sourcerecordid><originalsourceid>FETCH-LOGICAL-c408t-c9d32a5313c743a0446ce15364fd077311d1d126fbac1874f550d8eb40892ec33</originalsourceid><addsrcrecordid>eNqFkE1LxDAQhoMouK7-BQl48lCbSZqmPUrxkxUF9RzSNNGu3aYmXcF_b5bKiiCYHDJknncGHoSOgZwBKYoUREaTnJd5KhhNISVACcAOmm0bu9u6KPbRQQhLQlg8YobuLjqjR-96XBu1wk2rXnoXxlYHPDrX4VoF0-DYrl6NN_2b-8BeRWps41_bYzdEVnXYtrXx4RDtWdUFc_T9ztHz5cVTdZ0s7q9uqvNFojNSjIkuG0YVZ8C0yJgiWZZrA5zlmW2IEAygiZfmtlYaCpFZzklTmDqGS2o0Y3N0Ms0dvHtfmzDKpVv7Pq6UlAsOXJSliFQ-Udq7ELyxcvDtSvlPCURu1MmNFbkxJKM6CXJSF4OnU7B1w8_k24fq8Rcnh8ZGlv7B_rPgC7jGfJI</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>2575157997</pqid></control><display><type>article</type><title>Electron beam diagnostics tool based on Cherenkov radiation in optical fibers</title><source>Publicly Available Content Database</source><source>Free Full-Text Journals in Chemistry</source><creator>Vukolov, A V ; Novokshonov, A I ; Potylitsyn, A P ; Uglov, S R</creator><creatorcontrib>Vukolov, A V ; Novokshonov, A I ; Potylitsyn, A P ; Uglov, S R</creatorcontrib><description>The results of experimental investigations of Cherenkov radiation in optical fibers with 0.6 mm thickness which were used to scan an electron beam of 5.7 MeV energy are presented. Using such a technique for beam profile measurements it is possible to create a compact and reliable device compared to existing systems based on ionization chambers.</description><identifier>ISSN: 1742-6588</identifier><identifier>EISSN: 1742-6596</identifier><identifier>DOI: 10.1088/1742-6596/732/1/012011</identifier><language>eng</language><publisher>Bristol: IOP Publishing</publisher><subject>Cerenkov radiation ; Electron beams ; Ionization chambers ; Optical fibers ; Physics ; Radiation</subject><ispartof>Journal of physics. Conference series, 2016-07, Vol.732 (1), p.12011</ispartof><rights>Published under licence by IOP Publishing Ltd</rights><rights>2016. This work is published under http://creativecommons.org/licenses/by/3.0/ (the “License”). Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License.</rights><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c408t-c9d32a5313c743a0446ce15364fd077311d1d126fbac1874f550d8eb40892ec33</citedby><cites>FETCH-LOGICAL-c408t-c9d32a5313c743a0446ce15364fd077311d1d126fbac1874f550d8eb40892ec33</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://www.proquest.com/docview/2575157997?pq-origsite=primo$$EHTML$$P50$$Gproquest$$Hfree_for_read</linktohtml><link.rule.ids>314,780,784,25753,27924,27925,37012,44590</link.rule.ids></links><search><creatorcontrib>Vukolov, A V</creatorcontrib><creatorcontrib>Novokshonov, A I</creatorcontrib><creatorcontrib>Potylitsyn, A P</creatorcontrib><creatorcontrib>Uglov, S R</creatorcontrib><title>Electron beam diagnostics tool based on Cherenkov radiation in optical fibers</title><title>Journal of physics. Conference series</title><addtitle>J. Phys.: Conf. Ser</addtitle><description>The results of experimental investigations of Cherenkov radiation in optical fibers with 0.6 mm thickness which were used to scan an electron beam of 5.7 MeV energy are presented. Using such a technique for beam profile measurements it is possible to create a compact and reliable device compared to existing systems based on ionization chambers.</description><subject>Cerenkov radiation</subject><subject>Electron beams</subject><subject>Ionization chambers</subject><subject>Optical fibers</subject><subject>Physics</subject><subject>Radiation</subject><issn>1742-6588</issn><issn>1742-6596</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2016</creationdate><recordtype>article</recordtype><sourceid>PIMPY</sourceid><recordid>eNqFkE1LxDAQhoMouK7-BQl48lCbSZqmPUrxkxUF9RzSNNGu3aYmXcF_b5bKiiCYHDJknncGHoSOgZwBKYoUREaTnJd5KhhNISVACcAOmm0bu9u6KPbRQQhLQlg8YobuLjqjR-96XBu1wk2rXnoXxlYHPDrX4VoF0-DYrl6NN_2b-8BeRWps41_bYzdEVnXYtrXx4RDtWdUFc_T9ztHz5cVTdZ0s7q9uqvNFojNSjIkuG0YVZ8C0yJgiWZZrA5zlmW2IEAygiZfmtlYaCpFZzklTmDqGS2o0Y3N0Ms0dvHtfmzDKpVv7Pq6UlAsOXJSliFQ-Udq7ELyxcvDtSvlPCURu1MmNFbkxJKM6CXJSF4OnU7B1w8_k24fq8Rcnh8ZGlv7B_rPgC7jGfJI</recordid><startdate>20160701</startdate><enddate>20160701</enddate><creator>Vukolov, A V</creator><creator>Novokshonov, A I</creator><creator>Potylitsyn, A P</creator><creator>Uglov, S R</creator><general>IOP Publishing</general><scope>O3W</scope><scope>TSCCA</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>8FD</scope><scope>8FE</scope><scope>8FG</scope><scope>ABUWG</scope><scope>AFKRA</scope><scope>ARAPS</scope><scope>AZQEC</scope><scope>BENPR</scope><scope>BGLVJ</scope><scope>CCPQU</scope><scope>DWQXO</scope><scope>H8D</scope><scope>HCIFZ</scope><scope>L7M</scope><scope>P5Z</scope><scope>P62</scope><scope>PIMPY</scope><scope>PQEST</scope><scope>PQQKQ</scope><scope>PQUKI</scope><scope>PRINS</scope></search><sort><creationdate>20160701</creationdate><title>Electron beam diagnostics tool based on Cherenkov radiation in optical fibers</title><author>Vukolov, A V ; Novokshonov, A I ; Potylitsyn, A P ; Uglov, S R</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c408t-c9d32a5313c743a0446ce15364fd077311d1d126fbac1874f550d8eb40892ec33</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2016</creationdate><topic>Cerenkov radiation</topic><topic>Electron beams</topic><topic>Ionization chambers</topic><topic>Optical fibers</topic><topic>Physics</topic><topic>Radiation</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Vukolov, A V</creatorcontrib><creatorcontrib>Novokshonov, A I</creatorcontrib><creatorcontrib>Potylitsyn, A P</creatorcontrib><creatorcontrib>Uglov, S R</creatorcontrib><collection>Institute of Physics Open Access Journal Titles</collection><collection>IOPscience (Open Access)</collection><collection>CrossRef</collection><collection>Technology Research Database</collection><collection>ProQuest SciTech Collection</collection><collection>ProQuest Technology Collection</collection><collection>ProQuest Central (Alumni Edition)</collection><collection>ProQuest Central</collection><collection>Advanced Technologies &amp; Aerospace Collection</collection><collection>ProQuest Central Essentials</collection><collection>ProQuest Central</collection><collection>Technology Collection</collection><collection>ProQuest One Community College</collection><collection>ProQuest Central Korea</collection><collection>Aerospace Database</collection><collection>SciTech Premium Collection</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>Advanced Technologies &amp; Aerospace Database</collection><collection>ProQuest Advanced Technologies &amp; Aerospace Collection</collection><collection>Publicly Available Content Database</collection><collection>ProQuest One Academic Eastern Edition (DO NOT USE)</collection><collection>ProQuest One Academic</collection><collection>ProQuest One Academic UKI Edition</collection><collection>ProQuest Central China</collection><jtitle>Journal of physics. Conference series</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Vukolov, A V</au><au>Novokshonov, A I</au><au>Potylitsyn, A P</au><au>Uglov, S R</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Electron beam diagnostics tool based on Cherenkov radiation in optical fibers</atitle><jtitle>Journal of physics. Conference series</jtitle><addtitle>J. Phys.: Conf. Ser</addtitle><date>2016-07-01</date><risdate>2016</risdate><volume>732</volume><issue>1</issue><spage>12011</spage><pages>12011-</pages><issn>1742-6588</issn><eissn>1742-6596</eissn><abstract>The results of experimental investigations of Cherenkov radiation in optical fibers with 0.6 mm thickness which were used to scan an electron beam of 5.7 MeV energy are presented. Using such a technique for beam profile measurements it is possible to create a compact and reliable device compared to existing systems based on ionization chambers.</abstract><cop>Bristol</cop><pub>IOP Publishing</pub><doi>10.1088/1742-6596/732/1/012011</doi><tpages>7</tpages><oa>free_for_read</oa></addata></record>
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subjects Cerenkov radiation
Electron beams
Ionization chambers
Optical fibers
Physics
Radiation
title Electron beam diagnostics tool based on Cherenkov radiation in optical fibers
url http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-08T02%3A01%3A15IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Electron%20beam%20diagnostics%20tool%20based%20on%20Cherenkov%20radiation%20in%20optical%20fibers&rft.jtitle=Journal%20of%20physics.%20Conference%20series&rft.au=Vukolov,%20A%20V&rft.date=2016-07-01&rft.volume=732&rft.issue=1&rft.spage=12011&rft.pages=12011-&rft.issn=1742-6588&rft.eissn=1742-6596&rft_id=info:doi/10.1088/1742-6596/732/1/012011&rft_dat=%3Cproquest_cross%3E2575157997%3C/proquest_cross%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-c408t-c9d32a5313c743a0446ce15364fd077311d1d126fbac1874f550d8eb40892ec33%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_pqid=2575157997&rft_id=info:pmid/&rfr_iscdi=true