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Electron beam diagnostics tool based on Cherenkov radiation in optical fibers
The results of experimental investigations of Cherenkov radiation in optical fibers with 0.6 mm thickness which were used to scan an electron beam of 5.7 MeV energy are presented. Using such a technique for beam profile measurements it is possible to create a compact and reliable device compared to...
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Published in: | Journal of physics. Conference series 2016-07, Vol.732 (1), p.12011 |
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container_title | Journal of physics. Conference series |
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creator | Vukolov, A V Novokshonov, A I Potylitsyn, A P Uglov, S R |
description | The results of experimental investigations of Cherenkov radiation in optical fibers with 0.6 mm thickness which were used to scan an electron beam of 5.7 MeV energy are presented. Using such a technique for beam profile measurements it is possible to create a compact and reliable device compared to existing systems based on ionization chambers. |
doi_str_mv | 10.1088/1742-6596/732/1/012011 |
format | article |
fullrecord | <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_journals_2575157997</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>2575157997</sourcerecordid><originalsourceid>FETCH-LOGICAL-c408t-c9d32a5313c743a0446ce15364fd077311d1d126fbac1874f550d8eb40892ec33</originalsourceid><addsrcrecordid>eNqFkE1LxDAQhoMouK7-BQl48lCbSZqmPUrxkxUF9RzSNNGu3aYmXcF_b5bKiiCYHDJknncGHoSOgZwBKYoUREaTnJd5KhhNISVACcAOmm0bu9u6KPbRQQhLQlg8YobuLjqjR-96XBu1wk2rXnoXxlYHPDrX4VoF0-DYrl6NN_2b-8BeRWps41_bYzdEVnXYtrXx4RDtWdUFc_T9ztHz5cVTdZ0s7q9uqvNFojNSjIkuG0YVZ8C0yJgiWZZrA5zlmW2IEAygiZfmtlYaCpFZzklTmDqGS2o0Y3N0Ms0dvHtfmzDKpVv7Pq6UlAsOXJSliFQ-Udq7ELyxcvDtSvlPCURu1MmNFbkxJKM6CXJSF4OnU7B1w8_k24fq8Rcnh8ZGlv7B_rPgC7jGfJI</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>2575157997</pqid></control><display><type>article</type><title>Electron beam diagnostics tool based on Cherenkov radiation in optical fibers</title><source>Publicly Available Content Database</source><source>Free Full-Text Journals in Chemistry</source><creator>Vukolov, A V ; Novokshonov, A I ; Potylitsyn, A P ; Uglov, S R</creator><creatorcontrib>Vukolov, A V ; Novokshonov, A I ; Potylitsyn, A P ; Uglov, S R</creatorcontrib><description>The results of experimental investigations of Cherenkov radiation in optical fibers with 0.6 mm thickness which were used to scan an electron beam of 5.7 MeV energy are presented. Using such a technique for beam profile measurements it is possible to create a compact and reliable device compared to existing systems based on ionization chambers.</description><identifier>ISSN: 1742-6588</identifier><identifier>EISSN: 1742-6596</identifier><identifier>DOI: 10.1088/1742-6596/732/1/012011</identifier><language>eng</language><publisher>Bristol: IOP Publishing</publisher><subject>Cerenkov radiation ; Electron beams ; Ionization chambers ; Optical fibers ; Physics ; Radiation</subject><ispartof>Journal of physics. Conference series, 2016-07, Vol.732 (1), p.12011</ispartof><rights>Published under licence by IOP Publishing Ltd</rights><rights>2016. This work is published under http://creativecommons.org/licenses/by/3.0/ (the “License”). Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License.</rights><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c408t-c9d32a5313c743a0446ce15364fd077311d1d126fbac1874f550d8eb40892ec33</citedby><cites>FETCH-LOGICAL-c408t-c9d32a5313c743a0446ce15364fd077311d1d126fbac1874f550d8eb40892ec33</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://www.proquest.com/docview/2575157997?pq-origsite=primo$$EHTML$$P50$$Gproquest$$Hfree_for_read</linktohtml><link.rule.ids>314,780,784,25753,27924,27925,37012,44590</link.rule.ids></links><search><creatorcontrib>Vukolov, A V</creatorcontrib><creatorcontrib>Novokshonov, A I</creatorcontrib><creatorcontrib>Potylitsyn, A P</creatorcontrib><creatorcontrib>Uglov, S R</creatorcontrib><title>Electron beam diagnostics tool based on Cherenkov radiation in optical fibers</title><title>Journal of physics. Conference series</title><addtitle>J. Phys.: Conf. Ser</addtitle><description>The results of experimental investigations of Cherenkov radiation in optical fibers with 0.6 mm thickness which were used to scan an electron beam of 5.7 MeV energy are presented. Using such a technique for beam profile measurements it is possible to create a compact and reliable device compared to existing systems based on ionization chambers.</description><subject>Cerenkov radiation</subject><subject>Electron beams</subject><subject>Ionization chambers</subject><subject>Optical fibers</subject><subject>Physics</subject><subject>Radiation</subject><issn>1742-6588</issn><issn>1742-6596</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2016</creationdate><recordtype>article</recordtype><sourceid>PIMPY</sourceid><recordid>eNqFkE1LxDAQhoMouK7-BQl48lCbSZqmPUrxkxUF9RzSNNGu3aYmXcF_b5bKiiCYHDJknncGHoSOgZwBKYoUREaTnJd5KhhNISVACcAOmm0bu9u6KPbRQQhLQlg8YobuLjqjR-96XBu1wk2rXnoXxlYHPDrX4VoF0-DYrl6NN_2b-8BeRWps41_bYzdEVnXYtrXx4RDtWdUFc_T9ztHz5cVTdZ0s7q9uqvNFojNSjIkuG0YVZ8C0yJgiWZZrA5zlmW2IEAygiZfmtlYaCpFZzklTmDqGS2o0Y3N0Ms0dvHtfmzDKpVv7Pq6UlAsOXJSliFQ-Udq7ELyxcvDtSvlPCURu1MmNFbkxJKM6CXJSF4OnU7B1w8_k24fq8Rcnh8ZGlv7B_rPgC7jGfJI</recordid><startdate>20160701</startdate><enddate>20160701</enddate><creator>Vukolov, A V</creator><creator>Novokshonov, A I</creator><creator>Potylitsyn, A P</creator><creator>Uglov, S R</creator><general>IOP Publishing</general><scope>O3W</scope><scope>TSCCA</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>8FD</scope><scope>8FE</scope><scope>8FG</scope><scope>ABUWG</scope><scope>AFKRA</scope><scope>ARAPS</scope><scope>AZQEC</scope><scope>BENPR</scope><scope>BGLVJ</scope><scope>CCPQU</scope><scope>DWQXO</scope><scope>H8D</scope><scope>HCIFZ</scope><scope>L7M</scope><scope>P5Z</scope><scope>P62</scope><scope>PIMPY</scope><scope>PQEST</scope><scope>PQQKQ</scope><scope>PQUKI</scope><scope>PRINS</scope></search><sort><creationdate>20160701</creationdate><title>Electron beam diagnostics tool based on Cherenkov radiation in optical fibers</title><author>Vukolov, A V ; Novokshonov, A I ; Potylitsyn, A P ; Uglov, S R</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c408t-c9d32a5313c743a0446ce15364fd077311d1d126fbac1874f550d8eb40892ec33</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2016</creationdate><topic>Cerenkov radiation</topic><topic>Electron beams</topic><topic>Ionization chambers</topic><topic>Optical fibers</topic><topic>Physics</topic><topic>Radiation</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Vukolov, A V</creatorcontrib><creatorcontrib>Novokshonov, A I</creatorcontrib><creatorcontrib>Potylitsyn, A P</creatorcontrib><creatorcontrib>Uglov, S R</creatorcontrib><collection>Institute of Physics Open Access Journal Titles</collection><collection>IOPscience (Open Access)</collection><collection>CrossRef</collection><collection>Technology Research Database</collection><collection>ProQuest SciTech Collection</collection><collection>ProQuest Technology Collection</collection><collection>ProQuest Central (Alumni Edition)</collection><collection>ProQuest Central</collection><collection>Advanced Technologies & Aerospace Collection</collection><collection>ProQuest Central Essentials</collection><collection>ProQuest Central</collection><collection>Technology Collection</collection><collection>ProQuest One Community College</collection><collection>ProQuest Central Korea</collection><collection>Aerospace Database</collection><collection>SciTech Premium Collection</collection><collection>Advanced Technologies Database with Aerospace</collection><collection>Advanced Technologies & Aerospace Database</collection><collection>ProQuest Advanced Technologies & Aerospace Collection</collection><collection>Publicly Available Content Database</collection><collection>ProQuest One Academic Eastern Edition (DO NOT USE)</collection><collection>ProQuest One Academic</collection><collection>ProQuest One Academic UKI Edition</collection><collection>ProQuest Central China</collection><jtitle>Journal of physics. Conference series</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Vukolov, A V</au><au>Novokshonov, A I</au><au>Potylitsyn, A P</au><au>Uglov, S R</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Electron beam diagnostics tool based on Cherenkov radiation in optical fibers</atitle><jtitle>Journal of physics. Conference series</jtitle><addtitle>J. Phys.: Conf. Ser</addtitle><date>2016-07-01</date><risdate>2016</risdate><volume>732</volume><issue>1</issue><spage>12011</spage><pages>12011-</pages><issn>1742-6588</issn><eissn>1742-6596</eissn><abstract>The results of experimental investigations of Cherenkov radiation in optical fibers with 0.6 mm thickness which were used to scan an electron beam of 5.7 MeV energy are presented. Using such a technique for beam profile measurements it is possible to create a compact and reliable device compared to existing systems based on ionization chambers.</abstract><cop>Bristol</cop><pub>IOP Publishing</pub><doi>10.1088/1742-6596/732/1/012011</doi><tpages>7</tpages><oa>free_for_read</oa></addata></record> |
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subjects | Cerenkov radiation Electron beams Ionization chambers Optical fibers Physics Radiation |
title | Electron beam diagnostics tool based on Cherenkov radiation in optical fibers |
url | http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-08T02%3A01%3A15IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Electron%20beam%20diagnostics%20tool%20based%20on%20Cherenkov%20radiation%20in%20optical%20fibers&rft.jtitle=Journal%20of%20physics.%20Conference%20series&rft.au=Vukolov,%20A%20V&rft.date=2016-07-01&rft.volume=732&rft.issue=1&rft.spage=12011&rft.pages=12011-&rft.issn=1742-6588&rft.eissn=1742-6596&rft_id=info:doi/10.1088/1742-6596/732/1/012011&rft_dat=%3Cproquest_cross%3E2575157997%3C/proquest_cross%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-c408t-c9d32a5313c743a0446ce15364fd077311d1d126fbac1874f550d8eb40892ec33%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_pqid=2575157997&rft_id=info:pmid/&rfr_iscdi=true |